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1
Limited Effectiveness of IT/IS Investments in an Emerging Economy: Evidence from India and Implications
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Artigo
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Limited Effectiveness of IT/IS Investments in an Emerging Economy: Evidence from India and Implications

Thakurta, Rahul ; Guha Deb, Soumya

ACM SIGMIS Database: the DATABASE for Advances in Information Systems, 2023-02, Vol.54 (1), p.82-109 [Periódico revisado por pares]

New York, NY, USA: ACM

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2
CockroachDB: The Resilient Geo-Distributed SQL Database
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Ata de Congresso
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CockroachDB: The Resilient Geo-Distributed SQL Database

Taft, Rebecca ; Sharif, Irfan ; Matei, Andrei ; VanBenschoten, Nathan ; Lewis, Jordan ; Grieger, Tobias ; Niemi, Kai ; Woods, Andy ; Birzin, Anne ; Poss, Raphael ; Bardea, Paul ; Ranade, Amruta ; Darnell, Ben ; Gruneir, Bram ; Jaffray, Justin ; Zhang, Lucy ; Mattis, Peter

Proceedings of the 2020 ACM SIGMOD International Conference on Management of Data, 2020, p.1493-1509

New York, NY, USA: ACM

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3
On the Understandability of Design-Level Security Practices in Infrastructure-as-Code Scripts and Deployment Architectures
Material Type:
Artigo
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On the Understandability of Design-Level Security Practices in Infrastructure-as-Code Scripts and Deployment Architectures

Ntentos, Evangelos ; Lueger, Nicole Elisabeth ; Simhandl, Georg ; Zdun, Uwe ; Schneider, Simon ; Scandariato, Riccardo ; Ferreyra, Nicolás E. Díaz

ACM transactions on software engineering and methodology, 2024-09 [Periódico revisado por pares]

New York, NY: ACM

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4
Predicting defects using network analysis on dependency graphs
Material Type:
Ata de Congresso
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Predicting defects using network analysis on dependency graphs

Zimmermann, Thomas ; Nagappan, Nachiappan

2008 ACM/IEEE 30th International Conference on Software Engineering, 2008, Vol.2008 (24), p.531-540

New York, NY, USA: ACM

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5
Seamless Variability Management With the Virtual Platform
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Ata de Congresso
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Seamless Variability Management With the Virtual Platform

Mahmood, Wardah ; Strüber, Daniel ; Berger, Thorsten ; Lämmel, Ralf ; Mukelabai, Mukelabai

2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1658-1670

Piscataway, NJ, USA: IEEE Press

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6
An exploratory study of the pull-based software development model
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Ata de Congresso
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An exploratory study of the pull-based software development model

Gousios, Georgios ; Pinzger, Martin ; Deursen, Arie van

Proceedings of the 36th International Conference on Software Engineering, 2014, p.345-355

New York, NY, USA: ACM

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7
BullFrog: Online Schema Evolution via Lazy Evaluation
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BullFrog: Online Schema Evolution via Lazy Evaluation

Bhattacherjee, Souvik ; Liao, Gang ; Hicks, Michael ; Abadi, Daniel J.

Proceedings of the 2021 International Conference on Management of Data, 2021, p.194-206

New York, NY, USA: ACM

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8
A Comprehensive View on TD Prevention Practices and Reasons for not Preventing It
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Artigo
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A Comprehensive View on TD Prevention Practices and Reasons for not Preventing It

Freire, Sávio ; Pacheco, Alexia ; Rios, Nicolli ; Pérez, Boris ; Castellanos, Camilo ; Correal, Darío ; Ramač, Robert ; Mandić, Vladimir ; Taušan, Nebojša ; López, Gustavo ; Mendonça, Manoel ; Falessi, Davide ; Izurieta, Clemente ; Seaman, Carolyn ; Spínola, Rodrigo

ACM transactions on software engineering and methodology, 2024-06 [Periódico revisado por pares]

New York, NY: ACM

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9
An Operational Quality Model of Embedded Software Aligned with ISO 25000
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Artigo
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An Operational Quality Model of Embedded Software Aligned with ISO 25000

Argotti, Yann ; Kenfaoui, Yasmine ; Baron, Claude ; Abran, Alain ; Esteban, Philippe

ACM transactions on embedded computing systems, 2024-09 [Periódico revisado por pares]

New York, NY: ACM

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10
Enabling the Next Generation of Multi-Region Applications with CockroachDB
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Enabling the Next Generation of Multi-Region Applications with CockroachDB

VanBenschoten, Nathan ; Ajmani, Arul ; Gartner, Marcus ; Matei, Andrei ; Shah, Aayush ; Sharif, Irfan ; Shraer, Alexander ; Storm, Adam ; Taft, Rebecca ; Tan, Oliver ; Woods, Andy ; Walters, Peyton

Proceedings of the 2022 International Conference on Management of Data, 2022, p.2312-2325

New York, NY, USA: ACM

Sem texto completo

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