Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Report
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Multiscale thermal transportGraham, Samuel, Jr ; Wong, C. C ; Piekos, Edward StanleySandia National Laboratories 2004Sem texto completo |
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2 |
Material Type: Report
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Multiscale thermal transportGraham, Samuel Jr ; .) ; Wong, C C ; Piekos, Edward StanleyUnited States 2004Sem texto completo |
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3 |
Material Type: Ata de Congresso
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Thermal conductivity of periodically microporous silicon membranesSong, D. ; Chen, G.Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02, 2002, p.292-295IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Analysis of lattice thermal conductivity of Si thin filmsPing He ; Lilin Tian ; Litian Liu ; Zhijian Li2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443), 2001, Vol.2, p.1449-1452 vol.2IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Phonon Wave Heat Conduction in Thin Films and SuperlatticesChen, G.Journal of heat transfer, 1999-11, Vol.121 (4), p.945-953 [Periódico revisado por pares]United StatesSem texto completo |
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6 |
Material Type: Artigo
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Phonon group velocity and thermal conduction in superlatticesTamura, Shin-ichiro ; Tanaka, Yukihiro ; Maris, Humphrey J.Physical Review, B: Condensed Matter, 1999-07, Vol.60 (4), p.2627-2630United StatesSem texto completo |
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7 |
Material Type: Ata de Congresso
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Heat transfer in silicon nanostructuresJu, Y.S. ; Goodson, K.E.United States: American Society of Mechanical Engineers, New York, NY (US) 1999Sem texto completo |
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8 |
Material Type: Artigo
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Analysis of the effect of isotope scattering on the thermal conductivity of crystalline siliconCapinski, W. S. ; Maris, H. J. ; Tamura, S.Physical Review, B: Condensed Matter, 1999-04, Vol.59 (15), p.10105-10110United StatesSem texto completo |
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9 |
Material Type: Artigo
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Phonon scattering in thin silica films below 1 KVU, P. D ; OLSON, J. R ; POHL, R. OJournal of Low Temperature Physics, 1998-10, Vol.113 (1-2), p.123-139 [Periódico revisado por pares]Heidelberg: SpringerTexto completo disponível |
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10 |
Material Type: Artigo
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Measurement of the thermal conductivity of Si and GaAs wafers using the photothermal displacement techniqueKIM, J. H ; SEONG, D ; IHM, G. H ; RHEE, CInternational Journal of Thermophysics, 1998, Vol.19 (1), p.281-290 [Periódico revisado por pares]New York, NY: SpringerTexto completo disponível |