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An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron Microscopy
An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron Microscopy
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An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron Microscopy

Li, X.-Z.

Microscopy today, 2022-11, Vol.30 (6), p.20-27

New York, USA: Cambridge University Press

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A Real-Time Logging System for Managing Multiuser Equipment
A Real-Time Logging System for Managing Multiuser Equipment
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A Real-Time Logging System for Managing Multiuser Equipment

Li, X.-Z.

Microscopy today, 2018-01, Vol.26 (1), p.26-29

New York, USA: Cambridge University Press

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3
Electromigration Effect on Kinetics of Cu-Sn Intermetallic Compound Growth in Lead-Free Solder Joint
Electromigration Effect on Kinetics of Cu-Sn Intermetallic Compound Growth in Lead-Free Solder Joint
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Electromigration Effect on Kinetics of Cu-Sn Intermetallic Compound Growth in Lead-Free Solder Joint

Fu, Z. W. ; Zhou, B. ; Yao, R. H. ; Liu, Y. R. ; Li, X. P.

IEEE transactions on device and materials reliability, 2017-12, Vol.17 (4), p.773-779 [Periódico revisado por pares]

New York: IEEE

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4
Factors Affecting the Performance of Thermal Barrier Coatings in the Presence of V2O5 and Na2SO4
Factors Affecting the Performance of Thermal Barrier Coatings in the Presence of V2O5 and Na2SO4
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Factors Affecting the Performance of Thermal Barrier Coatings in the Presence of V2O5 and Na2SO4

Jonnalagadda, Krisha Praveen ; Eriksson, Robert ; Peng, Ru ; Li, X. -H. ; Johansson, Sten

JOURNAL OF CERAMIC SCIENCE AND TECHNOLOGY, 2016-12, Vol.7 (4), p.409

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5
Measuring GitHub Copilot's Impact on Productivity
Measuring GitHub Copilot's Impact on Productivity
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Measuring GitHub Copilot's Impact on Productivity

Ziegler, Albert ; Kalliamvakou, Eirini ; Li, X. Alice ; Rice, Andrew ; Rifkin, Devon ; Simister, Shawn ; Sittampalam, Ganesh ; Aftandilian, Edward

Communications of the ACM, 2024-03, Vol.67 (3), p.54-63

New York, NY, USA: ACM

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6
Stainless Steel: Low-Temperature Nitriding and Carburizing
Stainless Steel: Low-Temperature Nitriding and Carburizing
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Stainless Steel: Low-Temperature Nitriding and Carburizing

BELL, Thomas ; LI, Chen X

Advanced materials & processes, 2002-06, Vol.160 (6), p.49-51

Materials Park, OH: ASM International

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7
Reliable group rekeying: a performance analysis
Reliable group rekeying: a performance analysis
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Reliable group rekeying: a performance analysis

Yang, Yang Richard ; Li, X. Steve ; Zhang, X. Brian ; Lam, Simon S.

Computer communication review, 2001-10, Vol.31 (4), p.27-38

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8
The Lithosphere-Asthenosphere Boundary Beneath the Western United States
The Lithosphere-Asthenosphere Boundary Beneath the Western United States
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The Lithosphere-Asthenosphere Boundary Beneath the Western United States

Li, X ; Yuan, X ; Kind, R

Eos (Washington, D.C.), 2006-12, Vol.87 (52)

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Rapid Light Output Degradation of GaN-Based Packaged LED in the Early Stage of Humidity Test
Rapid Light Output Degradation of GaN-Based Packaged LED in the Early Stage of Humidity Test
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Rapid Light Output Degradation of GaN-Based Packaged LED in the Early Stage of Humidity Test

Cher Ming Tan ; Chen, B. K. ; Li, X. ; Chen, S. J.

IEEE transactions on device and materials reliability, 2012-03, Vol.12 (1), p.44-48 [Periódico revisado por pares]

New York: IEEE

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10
Fluid pressure and flow at great depth in the continental crust. A discussion in relation to topography, temperature and salinity distribution using as an example the KTB Fault Zones in connection with the Eger Rift Hot Spot
Fluid pressure and flow at great depth in the continental crust. A discussion in relation to topography, temperature and salinity distribution using as an example the KTB Fault Zones in connection with the Eger Rift Hot Spot
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Fluid pressure and flow at great depth in the continental crust. A discussion in relation to topography, temperature and salinity distribution using as an example the KTB Fault Zones in connection with the Eger Rift Hot Spot

Kessels, W ; Kuhlmann, S ; Li, X

Eos (Washington, D.C.), 2006-12, Vol.87 (52)

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