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Illegitimate Trade Detection for Electricity Energy Markets
Illegitimate Trade Detection for Electricity Energy Markets
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Illegitimate Trade Detection for Electricity Energy Markets

Sun, Hongbo ; Kitamura, Shoichi ; Nikovski, Daniel ; Mori, Kazuyuki ; Hashimoto, Hiroyuki

2020 International Conference on Smart Grids and Energy Systems (SGES), 2020, p.338-343

IEEE

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2
A Proposal for a Relief Supply Matching System
A Proposal for a Relief Supply Matching System
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A Proposal for a Relief Supply Matching System

Fukumoto, Junya ; Habu, Hirotaka ; Hashimoto, Hiroyuki

2018 5th International Conference on Information and Communication Technologies for Disaster Management (ICT-DM), 2018, p.1-8

IEEE

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3
Three-level co-optimization model for generation scheduling of integrated energy and regulation market
Three-level co-optimization model for generation scheduling of integrated energy and regulation market
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Three-level co-optimization model for generation scheduling of integrated energy and regulation market

Sun, Hongbo ; Takaguchi, Yusuke ; Nikovski, Daniel ; Hashimoto, Hiroyuki

2017 IEEE Innovative Smart Grid Technologies - Asia (ISGT-Asia), 2017, p.1-6

IEEE

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4
Optimization of nanomachining repair condition for ArF lithography
Optimization of nanomachining repair condition for ArF lithography
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Optimization of nanomachining repair condition for ArF lithography

Amano, Tsuyoshi ; Nishiguchi, Masaharu ; Hashimoto, Hiroyuki ; Morikawa, Yasutaka ; Hayashi, Naoya ; White, Roy ; Bozak, Ron ; Terrill, Lee

Proceedings of SPIE, 2003, Vol.5256, p.538-545

SPIE

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5
Defect inspection and repair performance on CPL masks for 90 and 65nm node line patterns
Defect inspection and repair performance on CPL masks for 90 and 65nm node line patterns
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Defect inspection and repair performance on CPL masks for 90 and 65nm node line patterns

Morikawa, Yasutaka ; Kojima, Kouichirou ; Hashimoto, Hiroyuki ; Yoshida, Yuuichi ; Sasaki, Shiho ; Mohri, Hiroshi ; Hayashi, Naoya

Proceedings of SPIE, 2004, Vol.5567, p.1339-1348

Bellingham WA: SPIE

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6
Mask CD compensation method using diffraction intensity for lithography equivalent metrology
Mask CD compensation method using diffraction intensity for lithography equivalent metrology
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Mask CD compensation method using diffraction intensity for lithography equivalent metrology

Nagai, Takaharu ; Sutou, Takanori ; Inazuki, Yuichi ; Hashimoto, Hiroyuki ; Toyama, Nobuhito ; Morikawa, Yasutaka ; Mohri, Hiroshi ; Hayashi, Naoya

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.7028, p.70281M-70281M-10

Bellingham, Wash: SPIE

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7
Mask CD measurement approach by diffraction intensity for lithography equivalent
Mask CD measurement approach by diffraction intensity for lithography equivalent
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Mask CD measurement approach by diffraction intensity for lithography equivalent

Nagai, Takaharu ; Mesuda, Kei ; Sutou, Takanori ; Inazuki, Yuichi ; Hashimoto, Hiroyuki ; Yokoyama, Toshifumi ; Toyama, Nobuhito ; Morikawa, Yasutaka ; Mohri, Hiroshi ; Hayashi, Naoya

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.6792, p.67920N-67920N-10

Bellingham, Wash: SPIE

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8
Mitigating substation demand fluctuations using decoupled price schemes for demand response
Mitigating substation demand fluctuations using decoupled price schemes for demand response
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Mitigating substation demand fluctuations using decoupled price schemes for demand response

Hongbo Sun ; Minot, Ariana ; Nikovski, Daniel ; Hashimoto, Hiroyuki ; Takano, Tomihiro ; Takaguchi, Yusuke

2016 IEEE Power & Energy Society Innovative Smart Grid Technologies Conference (ISGT), 2016, p.1-5

IEEE

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9
Quantitative TOF-SIMS imaging of DNA microarrays produced by bubble jet printing technique and the role of TOF-SIMS in life science industry
Quantitative TOF-SIMS imaging of DNA microarrays produced by bubble jet printing technique and the role of TOF-SIMS in life science industry
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Quantitative TOF-SIMS imaging of DNA microarrays produced by bubble jet printing technique and the role of TOF-SIMS in life science industry

HASHIMOTO, Hiroyuki ; NAKAMURA, Kumi ; TAKASE, Hiromitsu ; OKAMOTO, Tadashi ; YAMAMOTO, Nobuko

Applied surface science, 2004, Vol.231-32, p.385-391 [Periódico revisado por pares]

Amsterdam: Elsevier Science

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10
New treatments substantially increase LOT/FIT pressure to solve deep HTHP drilling challenges
New treatments substantially increase LOT/FIT pressure to solve deep HTHP drilling challenges
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New treatments substantially increase LOT/FIT pressure to solve deep HTHP drilling challenges

Hashimoto, Hiroyuki

Journal of the Japanese Association for Petroleum Technology, 2002, Vol.67(5), pp.465-474

Tokyo: The Japanese Association for Petroleum Technology

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