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Characterization and Failure Analysis of X-Ray Detector Diodes
Characterization and Failure Analysis of X-Ray Detector Diodes
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Characterization and Failure Analysis of X-Ray Detector Diodes

Redaelli, Edoardo

KTH, Skolan för informations- och kommunikationsteknik (ICT)

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2
Comparison test of standardized semiconductor components from different manufacturers. Part 1: Silicon diode, 1 amp (Temperature stress and electrical tests of semiconductor components for failure prediction)
Comparison test of standardized semiconductor components from different manufacturers. Part 1: Silicon diode, 1 amp (Temperature stress and electrical tests of semiconductor components for failure prediction)
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Comparison test of standardized semiconductor components from different manufacturers. Part 1: Silicon diode, 1 amp (Temperature stress and electrical tests of semiconductor components for failure prediction)

Lundqvist, G ; PILSAETER, B

Comparison test of standardized semiconductor components from different manufacturers. Part 1: Silicon diode, 1 amp (Temperature stress and electrical tests of semiconductor components for failure prediction), 1969, p.21P-21P

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3
RADIATION INDUCED TRANSIENT EFFECTS IN DIODES
RADIATION INDUCED TRANSIENT EFFECTS IN DIODES
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RADIATION INDUCED TRANSIENT EFFECTS IN DIODES

Leman, G.

1970

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4
Equipment for the control of radiation doses to the patients during treatment at tele-cobalt units, Radiumhemmet, Stockholm
Equipment for the control of radiation doses to the patients during treatment at tele-cobalt units, Radiumhemmet, Stockholm
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Equipment for the control of radiation doses to the patients during treatment at tele-cobalt units, Radiumhemmet, Stockholm

Baaryd, I. ; Olofsson, A.

Denmark 1971

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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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