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An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory
Abbas, Syed Mohsin ; Lee, Soonyoung ; Baeg, Sanghyeon ; Park, Sungju
Computers, IEEE Transactions on, 2014, Vol.63, p.2094-2098
IEEE
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High Availability Deployment of Virtual Network Function Forwarding Graph in Cloud Computing Environments
Abdelaal, Marwa A ; Ebrahim, Gamal A ; Anis, Wagdy R
Access, IEEE, 2021, Vol.9, p.53861-53884
IEEE
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Offloading Mechanisms Based on Reinforcement Learning and Deep Learning Algorithms in the Fog Computing Environment
Abdulazeez, Dezheen H ; Askar, Shavan K
Access, IEEE, 2023, Vol.11, p.12555-12586
IEEE
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Reinforcement Learning Based EV Charging Management Systems-A Review
Abdullah, Heba M ; Gastli, Adel ; Ben-Brahim, Lazhar
Access, IEEE, 2021, Vol.9, p.41506-41531
IEEE
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Potential-Game-Based 5G RAN Slice Planning for GBR Services
Adamuz-Hinojosa, Oscar ; Munoz, Pablo ; Ameigeiras, Pablo ; Lopez-Soler, Juan M
Access, IEEE, 2023, Vol.11, p.4763-4780
IEEE
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Sensing Using Coded Communications Signals
Aditya, Sundar ; Dizdar, Onur ; Clerckx, Bruno ; Li, Xueru
Communications Society, IEEE Open Journal of the, 2023, Vol.4, p.134-152
IEEE
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Control-Relevant Adaptive Personalized Modeling From Limited Clinical Data for Precise Warfarin Management
Affan, Affan ; Zurada, Jacek M ; Inanc, Tamer
Engineering in Medicine and Biology, IEEE Open Journal of, 2022, Vol.3, p.242-251
IEEE
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New Decentralised Event-Triggered Consensus Strategy for Single and Double Integrator Multi-Agent Systems
Aggarwal, Shubham ; Goyal, Jitendra Kumar ; Tr, Sanjay ; Ghosh, Sandip ; Kamal, Shyam ; Dworak, Pawel
Access, IEEE, 2020, Vol.8, p.157059-157067
IEEE
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An Overview on Medium Voltage Grid Integration of Ultra-Fast Charging Stations: Current Status and Future Trends
Ahmad, Adnan ; Qin, Zian ; Wijekoon, Thiwanka ; Bauer, Pavol
Industrial Electronics Society, IEEE Open Journal of the, 2022, Vol.3, p.420-447
IEEE
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Learning Software Project Management From Analyzing Q&A's in the Stack Exchange
Ahmadi, Alireza ; Delkhosh, Fatemeh ; Deshpande, Gouri ; Patterson, Raymond A ; Ruhe, Guenther
Access, IEEE, 2023, Vol.11, p.5429-5441
IEEE
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