Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Use of exposure compensation to improve device performance for speed and binning based on electrical parametric feedback into fabrication designAckmann, Paul W ; Brown, Stuart E ; Edwards, Richard D ; Downey, Doug ; Michael, Mark ; Turnquest, Karen L ; Nistler, John LSPIE 1997Texto completo disponível |
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2 |
Material Type: Artigo
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A Hierarchical Discriminant Analysis for Species Identification in Raw Meat by Visible and near Infrared SpectroscopyArnalds, Thorsteinn ; McElhinney, John ; Fearn, Tom ; Downey, GerardJournal of near infrared spectroscopy (United Kingdom), 2004-06, Vol.12 (3), p.183-188 [Periódico revisado por pares]London, England: SAGE PublicationsTexto completo disponível |
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3 |
Material Type: Artigo
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A MATHEMATICAL PROGRAMMING APPROACH FOR GENERATING ALTERNATIVES IN DISCRETE STRUCTURAL OPTIMIZATIONBAUGH, JOHN W. ; CALDWELL, SHANNON C. ; BRILL, E. DOWNEYEngineering optimization, 1997-05, Vol.28 (1-2), p.1-31 [Periódico revisado por pares]Taylor & Francis GroupTexto completo disponível |
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4 |
Material Type: Artigo
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Low Temperature Shallow Junction Formation For 70nm Technology Node And BeyondBorland, John O.MRS proceedings, 2002, Vol.717, Article C1.1New York, USA: Cambridge University PressSem texto completo |
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5 |
Material Type: Artigo
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MGA: a decision support system for complex, incompletely defined problemsBrill, E.D. ; Flach, J.M. ; Hopkins, L.D. ; Ranjithan, S.IEEE transactions on systems, man, and cybernetics, 1990-07, Vol.20 (4), p.745-757New York, NY: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Silicon carbide UV photodiodesBrown, D.M. ; Downey, E.T. ; Ghezzo, M. ; Kretchmer, J.W. ; Saia, R.J. ; Liu, Y.S. ; Edmond, J.A. ; Gati, G. ; Pimbley, J.M. ; Schneider, W.E.IEEE transactions on electron devices, 1993-02, Vol.40 (2), p.325-333 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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SiC MOS interface characteristicsBrown, D.M. ; Ghezzo, M. ; Kretchmer, J. ; Downey, E. ; Pimbley, J. ; Palmour, J.IEEE transactions on electron devices, 1994-04, Vol.41 (4), p.618-620 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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The Normativities of Engineers: Engineering Education and History of TechnologyBrown, John K. ; Lee Downey, Gary ; Diogo, Maria PaulaTechnology and culture, 2009-10, Vol.50 (4), p.737-752 [Periódico revisado por pares]Baltimore: Johns Hopkins University PressTexto completo disponível |
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9 |
Material Type: Artigo
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Probabilistic bounds for dual bin-packingBRUNO, J. L ; DOWNEY, P. JActa informatica, 1985-08, Vol.22 (3), p.333-345 [Periódico revisado por pares]Berlin: SpringerTexto completo disponível |
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10 |
Material Type: Artigo
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Probabilistic bounds on the performance of list schedulingBRUNO, J. L ; DOWNEY, P. JSIAM journal on computing, 1986-05, Vol.15 (2), p.409-417 [Periódico revisado por pares]Philadelphia, PA: Society for Industrial and Applied MathematicsTexto completo disponível |