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High-rate strength response of tantalum from dynamic hole closure experiments
High-rate strength response of tantalum from dynamic hole closure experiments
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High-rate strength response of tantalum from dynamic hole closure experiments

Nelms, Matthew ; Lind, Jonathan ; Margraf, Jonathan ; Basim Qamar, Sayyad ; Herrington, Joshua ; Robinson, Andrew ; Kumar, Mukul ; Barton, Nathan

Journal of applied physics, 2022-11, Vol.132 (17) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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2
Non-destructive depth-resolved characterization of residual strain fields in high electron mobility transistors using differential aperture x-ray microscopy
Non-destructive depth-resolved characterization of residual strain fields in high electron mobility transistors using differential aperture x-ray microscopy
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Non-destructive depth-resolved characterization of residual strain fields in high electron mobility transistors using differential aperture x-ray microscopy

Pagan, Darren C. ; Rasel, Md J. ; Lim, Rachel E. ; Sheyfer, Dina ; Liu, Wenjun ; Haque, Aman

Journal of applied physics, 2022-10, Vol.132 (14) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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3
Classification of computed thermal tomography images with deep learning convolutional neural network
Classification of computed thermal tomography images with deep learning convolutional neural network
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Classification of computed thermal tomography images with deep learning convolutional neural network

Ankel, V. ; Shribak, D. ; Chen, W. -Y. ; Heifetz, A.

Journal of applied physics, 2022-06, Vol.131 (24) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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4
Study of vacuum ultraviolet emission in helium and helium/nitrogen mixtures
Study of vacuum ultraviolet emission in helium and helium/nitrogen mixtures
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Study of vacuum ultraviolet emission in helium and helium/nitrogen mixtures

Fierro, Andrew ; Lehr, Jane ; Yee, Benjamin ; Barnat, Ed ; Moore, Chris ; Hopkins, Matthew ; Clem, Paul

Journal of applied physics, 2021-02, Vol.129 (7) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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5
Exploration of lattice Hamiltonians for functional and structural discovery via Gaussian process-based exploration–exploitation
Exploration of lattice Hamiltonians for functional and structural discovery via Gaussian process-based exploration–exploitation
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Exploration of lattice Hamiltonians for functional and structural discovery via Gaussian process-based exploration–exploitation

Kalinin, Sergei V. ; Valleti, Mani ; Vasudevan, Rama K. ; Ziatdinov, Maxim

Journal of applied physics, 2020-10, Vol.128 (16) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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6
Numerical simulation of streamer evolution in surface dielectric barrier discharge with electrode-array
Numerical simulation of streamer evolution in surface dielectric barrier discharge with electrode-array
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Numerical simulation of streamer evolution in surface dielectric barrier discharge with electrode-array

Zhang, Jiao ; Wang, Yanhui ; Wang, Dezhen ; Economou, Demetre J.

Journal of applied physics, 2020-09, Vol.128 (9) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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7
Tracking nanoparticle growth in pulsed carbon arc discharge
Tracking nanoparticle growth in pulsed carbon arc discharge
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Tracking nanoparticle growth in pulsed carbon arc discharge

Corbella, Carles ; Portal, Sabine ; Rao, Jiancun ; Kundrapu, Madhusudhan N. ; Keidar, Michael

Journal of applied physics, 2020-06, Vol.127 (24) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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8
Reconstruction of the interatomic forces from dynamic scanning transmission electron microscopy data
Reconstruction of the interatomic forces from dynamic scanning transmission electron microscopy data
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Reconstruction of the interatomic forces from dynamic scanning transmission electron microscopy data

Chakraborty, M. ; Ziatdinov, Maxim ; Dyck, Ondrej ; Jesse, Stephen ; White, Andrew D. ; Kalinin, Sergei V.

Journal of applied physics, 2020-06, Vol.127 (22) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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9
Probing unintentional Fe impurity incorporation in MOCVD homoepitaxy GaN: Toward GaN vertical power devices
Probing unintentional Fe impurity incorporation in MOCVD homoepitaxy GaN: Toward GaN vertical power devices
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Probing unintentional Fe impurity incorporation in MOCVD homoepitaxy GaN: Toward GaN vertical power devices

Zhang, Yuxuan ; Chen, Zhaoying ; Li, Wenbo ; Lee, Hyunsoo ; Karim, Md Rezaul ; Arehart, Aaron R. ; Ringel, Steven A. ; Rajan, Siddharth ; Zhao, Hongping

Journal of applied physics, 2020-06, Vol.127 (21) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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10
Investigation of dry-etch-induced defects in >600 V regrown, vertical, GaN, p-n diodes using deep-level optical spectroscopy
Investigation of dry-etch-induced defects in >600 V regrown, vertical, GaN, p-n diodes using deep-level optical spectroscopy
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Investigation of dry-etch-induced defects in >600 V regrown, vertical, GaN, p-n diodes using deep-level optical spectroscopy

Pickrell, G. W. ; Armstrong, A. M. ; Allerman, A. A. ; Crawford, M. H. ; Glaser, C. E. ; Kempisty, J. ; Abate, V. M.

Journal of applied physics, 2019-10, Vol.126 (14) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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