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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Ata de Congresso
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0-1 integer linear programming model for location selection of fire station: A case study in IndonesiaBahri, Susila Apri, Mochamad ; Takeuchi, YasuhiroAIP Conference Proceedings, 2016, Vol.1723 (1) [Periódico revisado por pares]Melville: American Institute of PhysicsSem texto completo |
| 2 |
Material Type: Ata de Congresso
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0/1 optimization and 0/1 primal separation are equivalentEisenbrand, Friedrich ; Rinaldi, Giovanni ; Ventura, PaoloProceedings of the thirteenth annual ACM-SIAM symposium on discrete algorithms, 2002, p.920-926Society for Industrial and Applied MathematicsTexto completo disponível |
| 3 |
Material Type: Ata de Congresso
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0.04 μm domain expansion readout for the MAMMOSAWANO, H ; SEKINE, M ; TANI, M ; KASAJIMA, N ; OHTA, N ; MITANI, K ; TAKAGI, N ; SUMI, SSPIE proceedings series, 1999, p.66-68Bellingham WA: SPIESem texto completo |
| 4 |
Material Type: Ata de Congresso
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0.040 rad(Si)/s total dose testing of Renesas parts proposed for the Europa Clipper missionvan Vonno, N. W. ; Gill, J. S. ; Ballou, F. C. ; Newman, W. H.2019 IEEE Radiation Effects Data Workshop, 2019, p.1-8IEEESem texto completo |
| 5 |
Material Type: Ata de Congresso
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0.1-nano-strain resolution fiber optic sensor for quasi-static strain measurement with 1 kS/s sampling rateChen, Jiageng ; Liu, Qingwen ; Fan, Xinyu ; Ma, Lin ; Du, Jiangbing ; Tokunaga, Tomochika ; He, Zuyuan Kalinowski, Hypolito J ; Fabris, José Luís ; Bock, Wojtek JSPIE 2015Sem texto completo |
| 6 |
Material Type: Ata de Congresso
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0.1-nanometer resolution positioning stage for sub-10 nm scanning probe lithographyVorbringer-Doroshovets, Nataliya ; Balzer, Felix ; Fuessl, Roland ; Manske, Eberhard ; Kaestner, Marcus ; Schuh, Andreas ; Zoellner, Jens-Peter ; Hofer, Manuel ; Guliyev, Elshad ; Ahmad, Ahmad ; Ivanov, Tzvetan ; Rangelow, Ivo W Resnick, Douglas J ; Tong, William MProceedings of SPIE, the international society for optical engineering, 2013, Vol.8680, p.868018-868018-10SPIESem texto completo |
| 7 |
Material Type: Ata de Congresso
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0.1-μm high-aspect-ratio pattern replication and linewidth controlChen, Zheng ; Vladimirsky, Yuli ; Cerrina, Franco ; Lai, Barry P ; Yun, Wenbing ; Gluskin, Efim SSPIE proceedings series, 1998, Vol.3331, p.591-600Bellingham WA: SPIETexto completo disponível |
| 8 |
Material Type: Ata de Congresso
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0.1 μm InGaAs/InAlAs/InP HEMT MMICs: a flight qualified technologyCHOU, Y. C ; LEUNG, D ; LAI, R ; GRUNDBACHER, R ; BARSKY, M ; KAN, Q ; TSAI, RTechnical digest - IEEE Gallium Arsenide Integrated Circuit Symposium, 2002, p.77-80Piscataway NJ: IEEETexto completo disponível |
| 9 |
Material Type: Ata de Congresso
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0.1 μm RFCMOS on high resistivity substrates for system on chip (SOC) applicationsYANG, J.-Y ; BENAISSA, K ; ASHBURN, S ; MADHANI, P ; BLYTHE, T ; SHICHIJO, H ; CRENSHAW, D ; WILLIAMS, B ; SRIDHAR, S ; AI, J ; BOSELLI, G ; ZHAO, S ; TANG, S.-P ; MAHALINGAM, NPiscataway NJ: IEEE 2002Texto completo disponível |
| 10 |
Material Type: Ata de Congresso
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0.11-μm imaging in KrF lithography using dipole illuminationEurlings, Mark ; van Setten, Eelco ; Torres, Juan Andres ; Dusa, Mircea V ; Socha, Robert J ; Capodieci, Luigi ; Finders, JoSPIE proceedings series, 2001, Vol.4404, p.266-278Bellingham WA: SPIETexto completo disponível |
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