Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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A Monte Carlo approach for power estimationBurch, R. ; Najm, F.N. ; Yang, P. ; Trick, T.N.IEEE transactions on very large scale integration (VLSI) systems, 1993-03, Vol.1 (1), p.63-71 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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VLSI architectures for discrete wavelet transformsParhi, K.K. ; Nishitani, T.IEEE transactions on very large scale integration (VLSI) systems, 1993-06, Vol.1 (2), p.191-202 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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Hierarchical design space exploration for a class of digital systemsSreenivasa Rao, D. ; Kurdahi, F.J.IEEE transactions on very large scale integration (VLSI) systems, 1993-09, Vol.1 (3), p.282-295 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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A study of the use of local interconnect in CMOS leaf cell designBachelu, C. ; Lefebvre, M.IEEE transactions on very large scale integration (VLSI) systems, 1993-12, Vol.1 (4), p.566-571 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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Distributed control schemes for fast arbitration in large crossbar networksGhosh, J. ; Varma, A. ; Krishnamurthy, N.IEEE transactions on very large scale integration (VLSI) systems, 1994-03, Vol.2 (1), p.54-67 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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Low power design using double edge triggered flip-flopsHossain, R. ; Wronski, L.D. ; Albicki, A.IEEE transactions on very large scale integration (VLSI) systems, 1994-06, Vol.2 (2), p.261-265 [Periódico revisado por pares]IEEETexto completo disponível |
7 |
Material Type: Artigo
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Algorithms and bounds for layer assignment of MCM routingHeydari, M.H. ; Tollis, I.G. ; Chunliang XisIEEE transactions on very large scale integration (VLSI) systems, 1994-06, Vol.2 (2), p.265-270, Article 265 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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A statistical study of defect maps of large area VLSI IC'sKoren, I. ; Koren, Z. ; Stapper, C.H.IEEE transactions on very large scale integration (VLSI) systems, 1994-06, Vol.2 (2), p.249-256 [Periódico revisado por pares]IEEETexto completo disponível |
9 |
Material Type: Artigo
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Testing complex couplings in multiport memoriesNicolaidis, M. ; Castro Alves, V. ; Bederr, H.IEEE transactions on very large scale integration (VLSI) systems, 1995-03, Vol.3 (1), p.59-71 [Periódico revisado por pares]IEEETexto completo disponível |
10 |
Material Type: Artigo
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Exact moment matching model of transmission lines and application to interconnect delay estimationQingjian Yu ; Kuh, E.S.IEEE transactions on very large scale integration (VLSI) systems, 1995-06, Vol.3 (2), p.311-322 [Periódico revisado por pares]IEEETexto completo disponível |