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Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin filmsBehler, Anna ; Teichert, Niclas ; Dutta, Biswanath ; Waske, Anja ; Hickel, Tilmann ; Auge, Alexander ; Hütten, Andreas ; Eckert, JürgenAIP advances, 2013-12, Vol.3 (12), p.122112-122112-9 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |