Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Measurement of small forces with superconducting magnetic bearingsWorden, P.W.Precision engineering, 1982-01, Vol.4 (3), p.139-144 [Periódico revisado por pares]Elsevier IncTexto completo disponível |
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2 |
Material Type: Artigo
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An optical characterization of defect levels induced by MBE growth of GaAsContour, J. P. ; Neu, G. ; Leroux, M. ; Chaix, C. ; Levesque, B. ; Etienne, P.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1983-07, Vol.1 (3), p.811-815Sem texto completo |
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3 |
Material Type: Artigo
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Instabilities of (110) III–V compounds grown by molecular beam epitaxyWang, W. I.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1983-07, Vol.1 (3), p.630-636Sem texto completo |
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4 |
Material Type: Artigo
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Cleaning chemistry of GaAs(100) and InSb(100) substrates for molecular beam epitaxyVasquez, R. P. ; Lewis, B. F. ; Grunthaner, F. J.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1983-07, Vol.1 (3), p.791-794Legacy CDMSSem texto completo |
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5 |
Material Type: Artigo
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Oxygen and hydrogen adsorption on GaAs(110)Bartels, F. ; Surkamp, L. ; Clemens, H. J. ; Mönch, W.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1983-07, Vol.1 (3), p.756-762Sem texto completo |
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6 |
Material Type: Artigo
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Investigation of localized annealing by electron beamsSun, H. T. ; McMahon, R. A. ; Ahmed, H.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1983-07, Vol.1 (3), p.827-831Sem texto completo |
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7 |
Material Type: Artigo
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Elevated temperature low energy ion cleaning of GaAsOelhafen, P. ; Freeouf, J. L. ; Pettit, G. D. ; Woodall, J. M.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1983-07, Vol.1 (3), p.787-790Sem texto completo |
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8 |
Material Type: Artigo
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Analysis of tool temperature fluctuation in interrupted cuttingChakraverti, G. ; Pandey, P.C. ; Mehta, N.K.Precision engineering, 1984-01, Vol.6 (2), p.99-105 [Periódico revisado por pares]New York, NY: Elsevier IncTexto completo disponível |
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9 |
Material Type: Artigo
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Precision internal threading of stainless steelSaotome, T. ; Yokoi, F. ; Kumabe, J.Precision engineering, 1984-01, Vol.6 (2), p.73-78 [Periódico revisado por pares]New York, NY: Elsevier IncTexto completo disponível |
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10 |
Material Type: Artigo
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Reduction of arsenic oxide contamination in molecular beam epitaxy vacuum chambersStall, R. A. ; Swaminathan, V. ; Schumaker, N.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1984-04, Vol.2 (2), p.148-150New York, NY: American Institute of PhysicsSem texto completo |