Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Long-term fluctuations associated with different standardsValdes, J. ; Porfiri, M.E. ; Lobbe, E.E. ; Kornblit, F. ; Passarino de Marques, M.N. ; Leiblich, J.A.IEEE transactions on instrumentation and measurement, 1993-04, Vol.42 (2), p.269-272 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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Fabrication of high-aspect-ratio microstructures on planar and nonplanar surfaces using a modified LIGA processMarques, C. ; Desta, Y.M. ; Rogers, J. ; Murphy, M.C. ; Kelly, K.Journal of microelectromechanical systems, 1997-12, Vol.6 (4), p.329-336 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Study of large area avalanche photodiode for detecting liquid xenon scintillationSolovov, V.N. ; Chepel, V. ; Lopes, M.I. ; Marques, R.F. ; Policarpo, A.J.P.L.1999 IEEE Nuclear Science Symposium. Conference Record. 1999 Nuclear Science Symposium and Medical Imaging Conference (Cat. No.99CH37019), 1999, Vol.2, p.718-721 vol.2IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Study of scintillation light from microstructure based detectorsFraga, M.M. ; Fetal, S.T.G. ; Fraga, F.A.F. ; Antunes, E. ; Goncalves, J. ; Bueno, C.C. ; Marques, R.F. ; Policarpo, A.J.P.L.1999 IEEE Nuclear Science Symposium. Conference Record. 1999 Nuclear Science Symposium and Medical Imaging Conference (Cat. No.99CH37019), 1999, Vol.2, p.654-659 vol.2IEEETexto completo disponível |
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5 |
Material Type: Ata de Congresso
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BUA osteoporosis diagnostic with single position vs scanning systems: a comparative studyMaia, J.M. ; Costa, E.T. ; da Silveira Nantes Button, V.L. ; Neto, J.F.M.2002 IEEE Ultrasonics Symposium, 2002. Proceedings, 2002, Vol.2, p.1289-1292 vol.2IEEETexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Atomistic modeling of B activation and deactivation for ultra-shallow junction formationAboy, M. ; Pelaz, L. ; Marques, L.A. ; Barbolla, J. ; Mokhberi, A. ; Takamura, Y. ; Griffin, P.B. ; Plummer, J.D.International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003, 2003, p.151-154IEEETexto completo disponível |
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7 |
Material Type: Ata de Congresso
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Analysis and potentialities of backside-illuminated thinned CMOS imagersMarques Vatus, Cecilia ; Magnan, PierreSPIE proceedings series, 2004, Vol.5251, p.178-186Bellingham WA: SPIETexto completo disponível |
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8 |
Material Type: Ata de Congresso
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Atomistic analysis of annealing behavior of amorphous regionsLopez, P. ; Pelaz, L. ; Marques, L.A. ; Santos, I. ; Aboy, M. ; Barbolla, J.Conference on Electron Devices, 2005 Spanish, 2005, p.427-430IEEETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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Morphology of as-implanted damage in silicon: a molecular dynamics studySantos, I. ; Marques, L.A. ; Pelaz, L. ; Aboy, M. ; Lopez, P. ; Barbolla, J.Conference on Electron Devices, 2005 Spanish, 2005, p.447-450IEEETexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Boron redistribution in pre-amorphized Si during thermal annealingPelaz, L. ; Aboy, M. ; Duffy, R. ; Venezia, V. ; Marques, L.A. ; Lopez, P. ; Santos, I. ; Hernandez, J. ; Bailon, L.A. ; Barbolla, J.Conference on Electron Devices, 2005 Spanish, 2005, p.431-434IEEETexto completo disponível |