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Vertical single- and double-walled carbon nanotubes grown from modified porous anodic alumina templates
Vertical single- and double-walled carbon nanotubes grown from modified porous anodic alumina templates
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Vertical single- and double-walled carbon nanotubes grown from modified porous anodic alumina templates

Maschmann, Matthew R ; Franklin, Aaron D ; Amama, Placidus B ; Zakharov, Dmitri N ; Stach, Eric A ; Sands, Timothy D ; Fisher, Timothy S

Nanotechnology, 2006-08, Vol.17 (15), p.3925-3929 [Periódico revisado por pares]

IOP Publishing

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2
Molecular-beam epitaxy-grown Si whisker structures: morphological, optical and electrical properties
Molecular-beam epitaxy-grown Si whisker structures: morphological, optical and electrical properties
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Molecular-beam epitaxy-grown Si whisker structures: morphological, optical and electrical properties

Naumova, O V ; Nastaushev, Yu V ; Svitasheva, S N ; Sokolov, L V ; Zakharov, N D ; Werner, P ; Gavrilova, T A ; Dultsev, F N ; Aseev, A L

Nanotechnology, 2008-06, Vol.19 (22), p.225708-225708 (5) [Periódico revisado por pares]

England: IOP Publishing

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3
@@iEx situ@ n and p doping of vertical epitaxial short silicon nanowires by ion implantation
@@iEx situ@ n and p doping of vertical epitaxial short silicon nanowires by ion implantation
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@@iEx situ@ n and p doping of vertical epitaxial short silicon nanowires by ion implantation

Kanungo, P D ; Koegler, R ; Nguyen-Duc, K ; Zakharov, N ; Werner, P ; Goesele, U

Nanotechnology, 2009-04, Vol.20 (16) [Periódico revisado por pares]

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4
Evolution of structural and physical properties upon annealing of sputter-deposited Zr0.84Y0.16-O2 films incorporating copper and palladium nanoparticles
Evolution of structural and physical properties upon annealing of sputter-deposited Zr0.84Y0.16-O2 films incorporating copper and palladium nanoparticles
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Evolution of structural and physical properties upon annealing of sputter-deposited Zr0.84Y0.16-O2 films incorporating copper and palladium nanoparticles

Zakharov, D I ; Horwat, D ; Endrino, J L ; Capon, F ; Pierson, J F

IOP conference series. Materials Science and Engineering, 2009-09, Vol.5 (1), p.012022-5 [Periódico revisado por pares]

Bristol: IOP Publishing

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5
MOVPE growth and study of ZnO, ZnMgO epilayers and ZnO/ZnMgO MQW structures
MOVPE growth and study of ZnO, ZnMgO epilayers and ZnO/ZnMgO MQW structures
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MOVPE growth and study of ZnO, ZnMgO epilayers and ZnO/ZnMgO MQW structures

Kuznetsov, P ; Lusanov, V ; Yakushcheva, G ; Jitov, V ; Zakharov, L ; Kotelyanskii, I ; Kozlovsky, V

IOP conference series. Materials Science and Engineering, 2010-02, Vol.8 (1), p.012040-012040 [Periódico revisado por pares]

Bristol: IOP Publishing

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6
Coordination of uranium(VI) with N,N'-diethyl-N,N'-ditolyldipicolinamide
Coordination of uranium(VI) with N,N'-diethyl-N,N'-ditolyldipicolinamide
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Coordination of uranium(VI) with N,N'-diethyl-N,N'-ditolyldipicolinamide

Lapka, J L ; Paulenova, A ; Zakharov, L N ; Alyapyshev, M Yu ; Babain, V A

IOP conference series. Materials Science and Engineering, 2010-03, Vol.9 (1), p.012029-012029 [Periódico revisado por pares]

Bristol: IOP Publishing

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7
Photoluminescence from silicon nanoparticles embedded in ammonium silicon hexafluoride
Photoluminescence from silicon nanoparticles embedded in ammonium silicon hexafluoride
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Photoluminescence from silicon nanoparticles embedded in ammonium silicon hexafluoride

Kalem, Seref ; Werner, Peter ; Talalaev, Vadim ; Becker, Michael ; Arthursson, Örjan ; Zakharov, Nikolai

Nanotechnology, 2010-10, Vol.21 (43), p.435701-435701 [Periódico revisado por pares]

England: IOP Publishing

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8
Observation of free surface-induced bending upon nanopatterning of ultrathin strained silicon layer
Observation of free surface-induced bending upon nanopatterning of ultrathin strained silicon layer
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Observation of free surface-induced bending upon nanopatterning of ultrathin strained silicon layer

Moutanabbir, Oussama ; Reiche, Manfred ; Zakharov, Nikolai ; Naumann, Falk ; Petzold, Matthias

Nanotechnology, 2011-01, Vol.22 (4), p.045701-045701 [Periódico revisado por pares]

England: IOP Publishing

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9
Characterization of plasmonic nanostructures by analytical TEM
Characterization of plasmonic nanostructures by analytical TEM
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Characterization of plasmonic nanostructures by analytical TEM

Suvorova, A ; Saunders, M ; Werner, P ; Zakharov, N ; Berger, A ; Pippel, E ; Losurdo, M ; Bruno, G

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12078-4 [Periódico revisado por pares]

Bristol: IOP Publishing

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10
Characterizing the geometry of In As nanowires using mirror electron microscopy
Characterizing the geometry of In As nanowires using mirror electron microscopy
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Characterizing the geometry of In As nanowires using mirror electron microscopy

Kennedy, S M ; Hjort, M ; Mandl, B ; Marsell, E ; Zakharov, A A ; Mikkelsen, A ; Paganin, D M ; Jesson, DE

Nanotechnology, 2012-03, Vol.23 (12), p.125703-1-9 [Periódico revisado por pares]

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