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Material Type: Ata de Congresso
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Multiple and Reproducible Fault Models on Micro-controller using Electromagnetic Fault Injection
Khuat, Vanthanh ; Trabelsi, Oualid ; Sauvage, Laurent ; Danger, Jean-Luc
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021, p.667-672
IEEE
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