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Second-harmonic microscopy of strain fields around through-silicon-viasCho, Yujin ; Shafiei, Farbod ; Mendoza, B. S. ; Lei, Ming ; Jiang, Tengfei ; Ho, P. S. ; Downer, M. C.Applied physics letters, 2016-04, Vol.108 (15) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |