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Robot Competition using ISO 29110
Robot Competition using ISO 29110
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Robot Competition using ISO 29110

De Jesus Oliva Palomo, Fatima ; Munoz, Mirna ; Avila, Uziel Jaramillo ; Gonzalez, Ezra Federico Parra

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.230-233

IEEE

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2
Challenges toward teaching international standards in higher education institutions
Challenges toward teaching international standards in higher education institutions
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Challenges toward teaching international standards in higher education institutions

Munoz, Mirna

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.46-51

IEEE

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3
Applying the first phases of software engineering for designing a brain-computer interface-based system
Applying the first phases of software engineering for designing a brain-computer interface-based system
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Applying the first phases of software engineering for designing a brain-computer interface-based system

Lopez, Sonia ; Lopez, Francisco ; Cervantes, Jose-Antonio ; Mexicano, Adriana ; Carmona, Jesus Carlos

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.10-18

IEEE

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4
Deep Learning for Nanoparticle Classification in SEM Micrographs: Systematic Mapping
Deep Learning for Nanoparticle Classification in SEM Micrographs: Systematic Mapping
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Deep Learning for Nanoparticle Classification in SEM Micrographs: Systematic Mapping

Toscano, Iker ; De-la-Torre, Miguel ; Juarez, Brenda Acevedo ; Garcia Mireles, Gabriel Alberto

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.119-125

IEEE

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5
Introduction to IoT Systems
Introduction to IoT Systems
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Introduction to IoT Systems

Cuevas Valencia, Rene Edmundo ; Zamora, Jorge Emmanuel Zamora ; Hernandez, Humberto Casares

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.227-229

IEEE

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6
Automatic recognition and license plate detection model based on OpenCV and Machine Learning
Automatic recognition and license plate detection model based on OpenCV and Machine Learning
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Automatic recognition and license plate detection model based on OpenCV and Machine Learning

Huallpa, Elias Ccoto ; Macalupu, Angel Abel Sullon ; Luque, Jorge Eddy Otazu ; Sanchez-Garces, Jorge

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.133-142

IEEE

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7
Unraveling the establishment of residual risk in cybersecurity
Unraveling the establishment of residual risk in cybersecurity
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Unraveling the establishment of residual risk in cybersecurity

Sanchez-Garcia, Isaac D. ; Feliu, Tomas San ; Calvo-Manzano, Jose A.

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.238-241

IEEE

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8
Estimation of current risk of suffering from mellitus diabetes from routine medical parameters
Estimation of current risk of suffering from mellitus diabetes from routine medical parameters
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Estimation of current risk of suffering from mellitus diabetes from routine medical parameters

Garcia, Arley Magnolia Aquino ; Aguilar-Lazcano, Carlos Alberto ; Perez-Espinosa, Humberto ; Gonzalez, Ansel Y. Rodriguez ; Navarrete, y Jose Antonio Rivas

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.173-179

IEEE

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9
Introduction to scientific video game design
Introduction to scientific video game design
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Introduction to scientific video game design

Bonilla Carranza, David ; Pena Perez Carranza, Adriana

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.242-244

IEEE

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10
Systematic mapping: Use of neural networks for analysis in transmission electron microscopy micrographs
Systematic mapping: Use of neural networks for analysis in transmission electron microscopy micrographs
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Systematic mapping: Use of neural networks for analysis in transmission electron microscopy micrographs

Bravo, Diego Morales ; De-la-Torre, Miguel ; Acevedo-Juarez, Brenda ; Mireles, Gabriel Alberto Garcia

2022 11th International Conference On Software Process Improvement (CIMPS), 2022, p.126-132

IEEE

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