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Rigorous optical modelling of long-wavelength infrared photodetector with 2D subwavelength hole array in gold film
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Rigorous optical modelling of long-wavelength infrared photodetector with 2D subwavelength hole array in gold film

Janaszek, Andrzej ; Wróbel, Piotr ; Dems, Maciej ; Ceylan, Omer ; Gurbuz, Yasar ; Kubiszyn, Łukasz ; Piotrowski, Józef ; Kotyński, Rafał

Opto-electronics review, 2024-01, p.148831-148831 [Periódico revisado por pares]

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2
Coded GFDM with decision feedback equaliser for enhanced performance in underwater wireless optical communication
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Coded GFDM with decision feedback equaliser for enhanced performance in underwater wireless optical communication

Hema, R. ; A., Ananthi ; C., Diana D.

Opto-electronics review, 2024-01, p.148697-148697 [Periódico revisado por pares]

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3
Cost-effective titania layers over 100 nm thick – effect of annealing on the structural, morphological, and optical properties
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Cost-effective titania layers over 100 nm thick – effect of annealing on the structural, morphological, and optical properties

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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4
Two-step etch in n-on-p type-II superlattices for surface leakage reduction in mid-wave infrared megapixel detectors
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Two-step etch in n-on-p type-II superlattices for surface leakage reduction in mid-wave infrared megapixel detectors

Ramos Santesmases, David ; Delmas, Marie ; Ivanov, Ruslan ; Zurauskaite, Laura ; Evans, Dean ; Almqvist, Susanne ; Becanovic, Smilja ; Hellström, Per-Erik ; Costard, Eric ; Hoglund, Linda

Opto-electronics review, 2023-01, Vol.31 (1) [Periódico revisado por pares]

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5
Carrier concentration and in-plane mobility in both non-intentionally and Si-doped InAsSb and InAs/InAsSb type-II superlattice materials for space-based infrared detectors
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Carrier concentration and in-plane mobility in both non-intentionally and Si-doped InAsSb and InAs/InAsSb type-II superlattice materials for space-based infrared detectors

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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6
A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty
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A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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7
Grating-free high-x InP/InxGa1-xAs mid-wavelength infrared QWIP focal plane array
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Grating-free high-x InP/InxGa1-xAs mid-wavelength infrared QWIP focal plane array

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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8
Application of the Tikhonov and the modified Twomey methods to calculate narrow microparticle size distributions by the laser diffraction technique
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Application of the Tikhonov and the modified Twomey methods to calculate narrow microparticle size distributions by the laser diffraction technique

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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9
Selected issues concerning the influence of irradiation on the characteristics of superconducting elements in modern FELs facilities
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Selected issues concerning the influence of irradiation on the characteristics of superconducting elements in modern FELs facilities

Sosnowski, Jacek

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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10
Testing surveillance thermal imagers under simulated real work conditions
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Testing surveillance thermal imagers under simulated real work conditions

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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