Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Getting Started with Visual Studio 2022: Learning and Implementing New FeaturesStrauss, DirkBerkeley, CA: Apress L. P 2022Sem texto completo |
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2 |
Material Type: Livro
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Test-Driven Development with React: Apply Test-Driven Development in Your ApplicationsQiu, JuntaoBerkeley, CA: Apress L. P 2021Sem texto completo |
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3 |
Material Type: Livro
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Practical WebDriverIO: Learn to Automate Effectively Using WebDriverIO APIsShukla, ShashankBerkeley, CA: Apress L. P 2021Sem texto completo |
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4 |
Material Type: Livro
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Open Source Fuzzing ToolsNoam Rathaus, Gadi EvronBurlington: Elsevier Science 2011Texto completo disponível |
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5 |
Material Type: Livro
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Static analysis of software: the abstract interpretationBoulanger, Jean-LouisHoboken, N.J: Wiley 2012Texto completo disponível |
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6 |
Material Type: Livro
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The Art of Software TestingMyers, Glenford J ; Badgett, Tom ; Sandler, CoreyHoboken: Wiley 2011Texto completo disponível |
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7 |
Material Type: Livro
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Software Reliability MethodsPeled, Doron A ; Clarke, E. MNew York, NY: Springer 2001Texto completo disponível |
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8 |
Material Type: Ata de Congresso
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High-Level Debugging and Verification for FPGA-Based Multicore ArchitecturesArcas Abella, Oriol ; Cristal, Adrian ; Unsal, Osman S.2015 IEEE 23rd Annual International Symposium on Field-Programmable Custom Computing Machines, 2015, p.135-142IEEETexto completo disponível |
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9 |
Material Type: Artigo
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A Survey on Software Fault LocalizationWong, W. Eric ; Ruizhi Gao ; Yihao Li ; Abreu, Rui ; Wotawa, FranzIEEE transactions on software engineering, 2016-08, Vol.42 (8), p.707-740 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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An Empirical Study of Fault Localization Families and Their CombinationsZou, Daming ; Liang, Jingjing ; Xiong, Yingfei ; Ernst, Michael D. ; Zhang, LuIEEE transactions on software engineering, 2021-02, Vol.47 (2), p.332-347 [Periódico revisado por pares]New York: IEEETexto completo disponível |