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Formation and optical properties of multi-stack InGaAs quantum dots embedded in GaAs nanowires by selective metalorganic chemical vapor deposition
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Formation and optical properties of multi-stack InGaAs quantum dots embedded in GaAs nanowires by selective metalorganic chemical vapor deposition

Tatebayashi, J. ; Ota, Y. ; Ishida, S. ; Nishioka, M. ; Iwamoto, S. ; Arakawa, Y.

Journal of crystal growth, 2013-05, Vol.370, p.299-302 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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Fin-Height Effect on Poly-Si/PVD-TiN Stacked-Gate FinFET Performance
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Fin-Height Effect on Poly-Si/PVD-TiN Stacked-Gate FinFET Performance

Hayashida, T. ; Endo, K. ; Liu, Y. ; O'uchi, S. ; Matsukawa, T. ; Mizubayashi, W. ; Migita, S. ; Morita, Y. ; Ota, H. ; Hashiguchi, H. ; Kosemura, D. ; Kamei, T. ; Tsukada, J. ; Ishikawa, Y. ; Yamauchi, H. ; Ogura, A. ; Masahara, M.

IEEE transactions on electron devices, 2012-03, Vol.59 (3), p.647-653 [Periódico revisado por pares]

New York, NY: IEEE

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Performance Improvement by Stress Memorization Technique in Trigate Silicon Nanowire MOSFETs
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Performance Improvement by Stress Memorization Technique in Trigate Silicon Nanowire MOSFETs

Saitoh, M. ; Nakabayashi, Y. ; Ota, K. ; Uchida, K. ; Numata, T.

IEEE electron device letters, 2012-01, Vol.33 (1), p.8-10 [Periódico revisado por pares]

New York, NY: IEEE

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4
Impedance Matching Method About Multiple Contactless Power Feeding System for Portable Electronic Devices
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Impedance Matching Method About Multiple Contactless Power Feeding System for Portable Electronic Devices

Ota, Y. ; Takura, T. ; Sato, F. ; Matsuki, H. ; Sato, T. ; Nonaka, T.

IEEE transactions on magnetics, 2011-10, Vol.47 (10), p.4235-4237

New York, NY: IEEE

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5
Subcellular Resolution Mapping of Endogenous Cytokine Secretion by Nano-Plasmonic-Resonator Sensor Array
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Subcellular Resolution Mapping of Endogenous Cytokine Secretion by Nano-Plasmonic-Resonator Sensor Array

Wang, Sheng ; Ota, Sadao ; Guo, Bin ; Ryu, Jongeun ; Rhodes, Christopher ; Xiong, Yi ; Kalim, Sheraz ; Zeng, Li ; Chen, Yong ; Teitell, Michael A ; Zhang, Xiang

Nano letters, 2011-08, Vol.11 (8), p.3431-3434 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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6
Lubricant Pickup of Ultra-Thin PFPE Lubricants With Different Backbone Structures
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Lubricant Pickup of Ultra-Thin PFPE Lubricants With Different Backbone Structures

Tani, H. ; Iwasaki, K. ; Maruyama, Y. ; Ota, I. ; Tagawa, N.

IEEE transactions on magnetics, 2011-07, Vol.47 (7), p.1837-1841

New York, NY: IEEE

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7
New method to isolate and distribute photoluminescence emissions from InAs quantum dots over a wide-wavelength range
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New method to isolate and distribute photoluminescence emissions from InAs quantum dots over a wide-wavelength range

Ohkouchi, S. ; Kumagai, N. ; Shirane, M. ; Igarashi, Y. ; Nomura, M. ; Ota, Y. ; Yorozu, S. ; Iwamoto, S. ; Arakawa, Y.

Journal of crystal growth, 2011-05, Vol.323 (1), p.250-253 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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8
Charged and neutral biexciton–exciton cascade in a single quantum dot within a photonic bandgap
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Charged and neutral biexciton–exciton cascade in a single quantum dot within a photonic bandgap

Shirane, M. ; Igarashi, Y. ; Ota, Y. ; Nomura, M. ; Kumagai, N. ; Ohkouchi, S. ; Kirihara, A. ; Ishida, S. ; Iwamoto, S. ; Yorozu, S. ; Arakawa, Y.

Physica. E, Low-dimensional systems & nanostructures, 2010-09, Vol.42 (10), p.2563-2566 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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9
Suppression of indefinite peaks in InAs/GaAs quantum dot spectrum by low temperature capping in the indium-flush method
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Suppression of indefinite peaks in InAs/GaAs quantum dot spectrum by low temperature capping in the indium-flush method

Kumagai, N. ; Ohkouchi, S. ; Nakagawa, S. ; Nomura, M. ; Ota, Y. ; Shirane, M. ; Igarashi, Y. ; Yorozu, S. ; Iwamoto, S. ; Arakawa, Y.

Physica. E, Low-dimensional systems & nanostructures, 2010-09, Vol.42 (10), p.2753-2756 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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10
AFM measurement of atomic-scale Si surface etching by active oxidation
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AFM measurement of atomic-scale Si surface etching by active oxidation

Morita, Y. ; Migita, S. ; Mizubayashi, W. ; Ota, H.

Surface science, 2010-08, Vol.604 (17), p.1432-1437 [Periódico revisado por pares]

Kidlington: Elsevier B.V

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