Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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11 |
Material Type: Artigo
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Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopyGuy, O.J. ; Doneddu, D. ; Chen, L. ; Jennings, M.R. ; Ackland, M.P. ; Baylis, R. ; Holton, M.D. ; Dunstan, P. ; Wilks, S.P. ; Mawby, P.A.Diamond and related materials, 2006-09, Vol.15 (9), p.1472-1477 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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12 |
Material Type: Artigo
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Investigation of the 4H–SiC surfaceGuy, O.J. ; Lodzinski, M. ; Teng, K.S. ; Maffeis, T.G.G. ; Tan, M. ; Blackwood, I. ; Dunstan, P.R. ; Al-Hartomy, O. ; Wilks, S.P. ; Wilby, T. ; Rimmer, N. ; Lewis, D. ; Hopkins, J.Applied surface science, 2008-10, Vol.254 (24), p.8098-8105 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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13 |
Material Type: Artigo
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Ellipsometric and XPS Studies of 4H-SiC/SiO2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC SurfacesGuy, Owen J. ; Chen, L. ; Pope, G. ; Teng, K.S. ; Maffeis, T. ; Wilks, S.P. ; Mawby, Philip A. ; Jenkins, T.E. ; Brieva, A. ; Hayton, D.J.Materials science forum, 2006-01, Vol.527-529, p.1027-1030 [Periódico revisado por pares]Sem texto completo |
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14 |
Material Type: Artigo
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Ellipsometric and MEIS Studies of 4H-SiC/Si/SiO2 and 4H-SiC/SiO2 Interfaces for MOS DevicesGuy, Owen J. ; Jenkins, T.E. ; Lodzinski, Michal ; Castaing, A. ; Wilks, S.P. ; Bailey, P. ; Noakes, T.C.Q.Materials science forum, 2007-01, Vol.556-557, p.509-512 [Periódico revisado por pares]Sem texto completo |
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15 |
Material Type: Artigo
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Investigation of Si/4H-SiC Hetero-Junction Growth and Electrical PropertiesGuy, Owen J. ; Pérez-Tomás, Amador ; Jennings, Michael R. ; Lodzinski, Michal ; Castaing, A. ; Mawby, Philip A. ; Covington, James A. ; Wilks, S.P. ; Hammond, R. ; Connolly, D. ; Jones, S. ; Hopkins, J. ; Wilby, T. ; Rimmer, N. ; Baker, K. ; Conway, S. ; Evans, S.Materials science forum, 2009-01, Vol.615-617, p.443-446 [Periódico revisado por pares]Sem texto completo |
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16 |
Material Type: Artigo
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Study of electron and proton isochoric heating for fast ignitionKey, M. H. ; Akli, K. ; Beg, F. ; Chen, M. H. ; Chung, H.-K. ; Freeman, R. R. ; Foord, M. E. ; Green, J. S. ; Gu, P. ; Gregori, G. ; Habara, H. ; Hatchett, S. P. ; Hey, D. ; Hill, J. M. ; King, J. A. ; Kodama, R. ; Koch, J. A. ; Lancaster, K. ; Lasinski, B. F. ; Langdon, B. ; MacKinnon, A. J. ; Murphy, C. D. ; Norreys, P. A. ; Patel, N. ; Patel, P. ; Pasley, J. ; Snavely, R. A. ; Stephens, R. B. ; Stoeckl, C. ; Tabak, M. ; Theobald, W. ; Tanaka, K. ; Town, R. ; Wilks, S. C. ; Yabuuchi, T. ; Zhang, B.Journal de Physique IV (Proceedings), 2006-06, Vol.133, p.371-378Sem texto completo |
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17 |
Material Type: Artigo
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Metal Contacts to Boron-Doped DiamondLodzinski, Michal ; Guy, Owen J. ; Castaing, A. ; Batcup, S. ; Wilks, S.P. ; Igic, P. ; Balmer, R.S. ; Wort, C.J.H. ; Lang, R.Materials science forum, 2009-01, Vol.615-617, p.995-998 [Periódico revisado por pares]Sem texto completo |
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18 |
Material Type: Ata de Congresso
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Studies of proton generation and focusing for fast ignition applicationsMacKinnon, A.J. ; Key, M.H. ; Akli, K. ; Beg, F. ; Clarke, R.J. ; Clark, D. ; Chen, M.H. ; Chung, H.-K. ; Chen, S. ; Freeman, R.R. ; Green, J.S. ; Gu, P. ; Gregori, G. ; Highbarger, K. ; Habara, H. ; Hatchett, S.P. ; Hey, D. ; Heathcote, R. ; Hill, J.M. ; King, J.A. ; Kodama, R. ; Koch, J.A. ; Lancaster, K. ; Lasinski, B.F. ; Langdon, B. ; Murphy, C.D. ; Norreys, P.A. ; Neely, D. ; Nakatsutsumi, M. ; Nakamura, H. ; Patel, N. ; Patel, P.K. ; Pasley, J. ; Snavely, R.A. ; Stephens, R.B. ; Stoeckl, C. ; Foord, M. ; Tabak, M. ; Theobald, W. ; Storm, M. ; Tanaka, K. ; Tampo, M. ; Tolley, M. ; Town, R. ; Wilks, S.C. ; Van Woerkom, L. ; Weber, R. ; Yabuuchi, T. ; Zhang, B.The 33rd IEEE International Conference on Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts, 2006, p.371-371IEEETexto completo disponível |
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19 |
Material Type: Artigo
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STM and XPS characterisation of vacuum annealed nanocrystalline WO3 filmsMAFFEIS, T. G. G ; YUNG, D ; LEPENNEC, L ; PENNY, M. W ; COBLEY, R. J ; COMINI, E ; SBERVEGLIERI, G ; WILKS, S. PSurface science, 2007-11, Vol.601 (21), p.4953-4957 [Periódico revisado por pares]Lausanne: Elsevier ScienceTexto completo disponível |
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20 |
Material Type: Artigo
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STM and XPS characterisation of vacuum annealed nanocrystalline WO 3 filmsMaffeis, T.G.G. ; Yung, D. ; LePennec, L. ; Penny, M.W. ; Cobley, R.J. ; Comini, E. ; Sberveglieri, G. ; Wilks, S.P.Surface science, 2007, Vol.601 (21), p.4953-4957 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |