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1
HIGH FREQUENCY ELECTRICAL CHARACTERIZATION OF 3D SIGNAL/GROUND THROUGH SILICON VIAS
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HIGH FREQUENCY ELECTRICAL CHARACTERIZATION OF 3D SIGNAL/GROUND THROUGH SILICON VIAS

Adamshick, Steve ; Carroll, Robert ; Rao, Megha ; La Tuplie, Douglas ; Kruger, Seth ; Burke, John ; Liehr, Michael

Progress in electromagnetics research. Letters, 2014, Vol.47, p.71-75 [Periódico revisado por pares]

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2
The application of porous silicon to optical waveguiding technology
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The application of porous silicon to optical waveguiding technology

Arrand, H.F. ; Benson, T.M. ; Sewell, P. ; Loni, A. ; Bozeat, R.J. ; Arens-Fischer, R. ; Kruger, M. ; Thonissen, M. ; Luth, H.

IEEE journal of selected topics in quantum electronics, 1998-11, Vol.4 (6), p.975-982 [Periódico revisado por pares]

IEEE

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3
Improved actuation strain of PDMS-based DEA materials chemically modified with softening agents
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Ata de Congresso
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Improved actuation strain of PDMS-based DEA materials chemically modified with softening agents

Biedermann, Miriam ; Blümke, Martin ; Wegener, Michael ; Krüger, Hartmut Bar-Cohen, Yoseph

SPIE 2015

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4
Evaluating the Performance of Functionalized Carbon Structures with Integrated Optical Fiber Sensors under Practical Conditions
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Evaluating the Performance of Functionalized Carbon Structures with Integrated Optical Fiber Sensors under Practical Conditions

Bremer, Kort ; Alwis, Lourdes S M ; Weigand, Frank ; Kuhne, Michael ; Zheng, Yulong ; Krüger, Marco ; Helbig, Reinhard ; Roth, Bernhard

Sensors (Basel, Switzerland), 2018-11, Vol.18 (11), p.3923 [Periódico revisado por pares]

Switzerland: MDPI

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5
Simple Route to Enhancement of Soft X-Ray High Harmonic Generation Sources
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Ata de Congresso
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Simple Route to Enhancement of Soft X-Ray High Harmonic Generation Sources

Bruner, Barry D. ; Arusi-Parpar, Talya ; Kruger, Michael ; Dudovich, Nirit

2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2019, p.1-1

IEEE

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6
Bow Reduction of AlInGaN-Based Deep UV LED Wafers Using Focused Laser Patterning
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Bow Reduction of AlInGaN-Based Deep UV LED Wafers Using Focused Laser Patterning

Cho, Hyun Kyong ; Kulberg, Alex ; Lobo Ploch, Neysha ; Rass, Jens ; Ruschel, Jan ; Kolbe, Tim ; Knauer, Ana ; Braun, Andrea ; Kruger, Olaf ; Einfeldt, Sven ; Weyers, Markus ; Kneissl, Michael

IEEE photonics technology letters, 2018-10, Vol.30 (20), p.1792-1794

New York: IEEE

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7
Investigation of the solder joint fatigue life in combined vibration and thermal cycling tests
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Ata de Congresso
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Investigation of the solder joint fatigue life in combined vibration and thermal cycling tests

Eckert, Tilman ; Kruger, Michael ; Müller, Wolfgang H ; Nissen, Nils F ; Reichl, Herbert

2010 Proceedings 60th Electronic Components and Technology Conference (ECTC), 2010, p.1209-1216

IEEE

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8
Tracking of Human Body Parts using the Multiocular Contracting Curve Density Algorithm
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Tracking of Human Body Parts using the Multiocular Contracting Curve Density Algorithm

Hahn, M. ; Kruger, L. ; Wohler, C. ; Gross, H.-M.

Sixth International Conference on 3-D Digital Imaging and Modeling (3DIM 2007), 2007, p.257-264

IEEE

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9
Passive Submillimeter-wave Stand-off Video Camera for Security Applications
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Passive Submillimeter-wave Stand-off Video Camera for Security Applications

Heinz, Erik ; May, Torsten ; Born, Detlef ; Zieger, Gabriel ; Anders, Solveig ; Thorwirth, Günter ; Zakosarenko, Viatcheslav ; Schubert, Marco ; Krause, Torsten ; Starkloff, Michael ; Krüger, André ; Schulz, Marco ; Bauer, Frank ; Meyer, Hans-Georg

Journal of infrared, millimeter and terahertz waves, 2010-11, Vol.31 (11), p.1355-1369 [Periódico revisado por pares]

Boston: Springer US

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10
Application of the UHF technology to detect and locate partial discharges in liquid immersed transformer
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Artigo
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Application of the UHF technology to detect and locate partial discharges in liquid immersed transformer

Hoek, Stefan M. ; Krüger, Michael ; Körber, Stephan ; Kraetge, Alexander

Elektrotechnik und Informationstechnik, 2014-12, Vol.131 (8), p.386-392 [Periódico revisado por pares]

Vienna: Springer Vienna

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