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Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Eren, B ; Material Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 ; Gysin, U ; Marot, L ; Glatzel, Th ; Steiner, R ; Meyer, E

Applied Physics Letters, 25 January 2016, Vol.108(4) [Periódico revisado por pares]

SciTech Connect (U.S. Dept. of Energy - Office of Scientific and Technical Information)

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Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Eren, B. ; Gysin, U. ; Marot, L. ; Glatzel, Th. ; Steiner, R. ; Meyer, E.

Applied Physics Letters, 25 January 2016, Vol.108(4) [Periódico revisado por pares]

© 2016 AIP Publishing LLC (AIP)

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