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Refinado por: assunto: Mustererkennung remover
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1
Pattern theory from representation to inference
Pattern theory from representation to inference
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Pattern theory from representation to inference

Ulf Grenander Michael I Miller

Oxford Oxford University Press 2007

Localização: IME - Inst. Matemática e Estatística    (QA862 G826p )(Acessar)

2
Pattern recognition 27th DAGM Symposium, Vienna, Austria, August 31-September 2, 2005 proceedings
Pattern recognition 27th DAGM Symposium, Vienna, Austria, August 31-September 2, 2005 proceedings
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Pattern recognition 27th DAGM Symposium, Vienna, Austria, August 31-September 2, 2005 proceedings

DAGM (Organization) Symposium (27th 2005 Vienna, Austria) W Kropatsch (Walter); Robert Sablatnig; Allan Hanbury

Berlin Springer New York 2005

Acesso online. A biblioteca também possui exemplares impressos.

3
Pattern classification using ensemble methods
Pattern classification using ensemble methods
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Pattern classification using ensemble methods

Lior Rokach

Hackensack, NJ World Scientific c2010

Localização: ICMC - Inst. Ciên. Mat. Computação    (68T45.20 R742pr e.1 ) e outros locais(Acessar)

4
Handbook of pattern recognition and computer vision
Handbook of pattern recognition and computer vision
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Handbook of pattern recognition and computer vision

C. H Chen (Chi-hau), 1937-

London Imperial College Press Singapore Hackensack, NJ World Scientific Pub c2010

Localização: IFSC - Inst. Física de São Carlos    (621.3819598 C518h 4. ed. )(Acessar)

5
Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers
Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers
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Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers

GREC 2003 (2003 Barcelona, Spain) Josep Llad os 1968; Young-Bin Kwon

Berlin Springer New York c2004

Acesso online. A biblioteca também possui exemplares impressos.

6
Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings
Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings
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Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings

Iberoamerican Congress on Pattern Recognition (9th 2004 Puebla, Mexico) Alberto Sanfeliu; Jos e Francisco Mart inez Trinidad; Jes us Ariel Carrasco Ochoa

Berlin Springer New York, N.Y 2004

Acesso online. A biblioteca também possui exemplares impressos.

7
Energy minimization methods in computer vision and pattern recognition 5th International Workshop, EMMCVPR 2005, St. Augustine, FL, USA November 9-11, 2005 : proceedings
Energy minimization methods in computer vision and pattern recognition 5th International Workshop, EMMCVPR 2005, St. Augustine, FL, USA November 9-11, 2005 : proceedings
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Energy minimization methods in computer vision and pattern recognition 5th International Workshop, EMMCVPR 2005, St. Augustine, FL, USA November 9-11, 2005 : proceedings

EMMCVPR 2005 (2005 Saint Aug.ine, Fla.) Anand Rangarajan; Baba C Vemuri; A. L Yuille (Alan L.)

Berlin Springer c2005

Localização: ICMC - Inst. Ciên. Mat. Computação    (68-02 LNCS v.3757 ) e outros locais(Acessar)

8
Image processing and pattern recognition
Image processing and pattern recognition
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Image processing and pattern recognition

Cornelius T Leondes

San Diego, Calif. Academic Press c1998

Localização: FEA - Fac. Econ. Adm. Contab. e Atuária    (006.4 I31 )(Acessar)

9
Machine learning and data mining in pattern recognition 4th international conference, MLDM 2005, Leipzig, Germany, July 9-11 2005 : proceedings
Machine learning and data mining in pattern recognition 4th international conference, MLDM 2005, Leipzig, Germany, July 9-11 2005 : proceedings
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Machine learning and data mining in pattern recognition 4th international conference, MLDM 2005, Leipzig, Germany, July 9-11 2005 : proceedings

MLDM 2005 (2005 Leipzig, Germany) Petra Perner; Atsushi Imiya; Industrial Conference on Data Mining (2005 Leipzig, Germany)

Berlin Springer New York c2005

Acesso online. A biblioteca também possui exemplares impressos.

10
Machine learning in document analysis and recognition
Machine learning in document analysis and recognition
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Machine learning in document analysis and recognition

Simone Marinai; Hiromichi Fujisawa

Berlin Springer c2008

Localização: IME - Inst. Matemática e Estatística    (QA860.C3 M337m )(Acessar)

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Deste Autor:

  1. Imiya, A
  2. GREC 2003
  3. Vemuri, B
  4. MLDM 2005
  5. Fujisawa, H

Neste Assunto:

  1. Mustererkennung
  2. Mustererkennung
  3. Pattern Recognition Systems
  4. Reconnaissance Des Formes
  5. Pattern Recognition

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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