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Femtosecond free-electron laser x-ray diffraction data sets for algorithm development
Femtosecond free-electron laser x-ray diffraction data sets for algorithm development
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Femtosecond free-electron laser x-ray diffraction data sets for algorithm development

Kassemeyer, Stephan ; Steinbrener, Jan ; Lomb, Lukas ; Hartmann, Elisabeth ; Aquila, Andrew ; Barty, Anton ; Martin, Andrew V ; Hampton, Christina Y ; Bajt, Saša ; Barthelmess, Miriam ; Barends, Thomas R M ; Bostedt, Christoph ; Bott, Mario ; Bozek, John D ; Coppola, Nicola ; Cryle, Max ; DePonte, Daniel P ; Doak, R Bruce ; Epp, Sascha W ; Erk, Benjamin ; Fleckenstein, Holger ; Foucar, Lutz ; Graafsma, Heinz ; Gumprecht, Lars ; Hartmann, Andreas ; Hartmann, Robert ; Hauser, Günter ; Hirsemann, Helmut ; Hömke, André ; Holl, Peter ; Jönsson, Olof ; Kimmel, Nils ; Krasniqi, Faton ; Liang, Mengning ; Maia, Filipe R N C ; Marchesini, Stefano ; Nass, Karol ; Reich, Christian ; Rolles, Daniel ; Rudek, Benedikt ; Rudenko, Artem ; Schmidt, Carlo ; Schulz, Joachim ; Shoeman, Robert L ; Sierra, Raymond G ; Soltau, Heike ; Spence, John C H ; Starodub, Dmitri ; Stellato, Francesco ; Stern, Stephan ; Stier, Gunter ; Svenda, Martin ; Weidenspointner, Georg ; Weierstall, Uwe ; White, Thomas A ; Wunderer, Cornelia ; Frank, Matthias ; Chapman, Henry N ; Ullrich, Joachim ; Strüder, Lothar ; Bogan, Michael J ; Schlichting, Ilme

Optics express, 2012-02, Vol.20 (4), p.4149-4158 [Periódico revisado por pares]

United States

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2
Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements
Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements
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Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

Barty, Anton ; Caleman, Carl ; Aquila, Andrew ; Timneanu, Nicusor ; Lomb, Lukas ; White, Thomas A. ; Andreasson, Jakob ; Arnlund, David ; Bajt, Saša ; Barends, Thomas R. M. ; Barthelmess, Miriam ; Bogan, Michael J. ; Bostedt, Christoph ; Bozek, John D. ; Coffee, Ryan ; Coppola, Nicola ; Davidsson, Jan ; DePonte, Daniel P. ; Doak, R. Bruce ; Ekeberg, Tomas ; Elser, Veit ; Epp, Sascha W. ; Erk, Benjamin ; Fleckenstein, Holger ; Foucar, Lutz ; Fromme, Petra ; Graafsma, Heinz ; Gumprecht, Lars ; Hajdu, Janos ; Hampton, Christina Y. ; Hartmann, Robert ; Hartmann, Andreas ; Hauser, Günter ; Hirsemann, Helmut ; Holl, Peter ; Hunter, Mark S. ; Johansson, Linda ; Kassemeyer, Stephan ; Kimmel, Nils ; Kirian, Richard A. ; Liang, Mengning ; Maia, Filipe R. N. C. ; Malmerberg, Erik ; Marchesini, Stefano ; Martin, Andrew V. ; Nass, Karol ; Neutze, Richard ; Reich, Christian ; Rolles, Daniel ; Rudek, Benedikt ; Rudenko, Artem ; Scott, Howard ; Schlichting, Ilme ; Schulz, Joachim ; Seibert, M. Marvin ; Shoeman, Robert L. ; Sierra, Raymond G. ; Soltau, Heike ; Spence, John C. H. ; Stellato, Francesco ; Stern, Stephan ; Strüder, Lothar ; Ullrich, Joachim ; Wang, X. ; Weidenspointner, Georg ; Weierstall, Uwe ; Wunderer, Cornelia B. ; Chapman, Henry N.

Nature photonics, 2011-12, Vol.6 (1) [Periódico revisado por pares]

United States: Nature Publishing Group

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3
Femtosecond X-ray protein nanocrystallography
Femtosecond X-ray protein nanocrystallography
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Femtosecond X-ray protein nanocrystallography

Chapman, Henry N. ; Fromme, Petra ; Barty, Anton ; White, Thomas A. ; Kirian, Richard A. ; Aquila, Andrew ; Hunter, Mark S. ; Schulz, Joachim ; DePonte, Daniel P. ; Weierstall, Uwe ; Doak, R. Bruce ; Maia, Filipe R. N. C. ; Martin, Andrew V. ; Schlichting, Ilme ; Lomb, Lukas ; Coppola, Nicola ; Shoeman, Robert L. ; Epp, Sascha W. ; Hartmann, Robert ; Rolles, Daniel ; Rudenko, Artem ; Foucar, Lutz ; Kimmel, Nils ; Weidenspointner, Georg ; Holl, Peter ; Liang, Mengning ; Barthelmess, Miriam ; Caleman, Carl ; Boutet, Sébastien ; Bogan, Michael J. ; Krzywinski, Jacek ; Bostedt, Christoph ; Bajt, Saša ; Gumprecht, Lars ; Rudek, Benedikt ; Erk, Benjamin ; Schmidt, Carlo ; Hömke, André ; Reich, Christian ; Pietschner, Daniel ; Strüder, Lothar ; Hauser, Günter ; Gorke, Hubert ; Ullrich, Joachim ; Herrmann, Sven ; Schaller, Gerhard ; Schopper, Florian ; Soltau, Heike ; Kühnel, Kai-Uwe ; Messerschmidt, Marc ; Bozek, John D. ; Hau-Riege, Stefan P. ; Frank, Matthias ; Hampton, Christina Y. ; Sierra, Raymond G. ; Starodub, Dmitri ; Williams, Garth J. ; Hajdu, Janos ; Timneanu, Nicusor ; Seibert, M. Marvin ; Andreasson, Jakob ; Rocker, Andrea ; Jönsson, Olof ; Svenda, Martin ; Stern, Stephan ; Nass, Karol ; Andritschke, Robert ; Schröter, Claus-Dieter ; Krasniqi, Faton ; Bott, Mario ; Schmidt, Kevin E. ; Wang, Xiaoyu ; Grotjohann, Ingo ; Holton, James M. ; Barends, Thomas R. M. ; Neutze, Richard ; Marchesini, Stefano ; Fromme, Raimund ; Schorb, Sebastian ; Rupp, Daniela ; Adolph, Marcus ; Gorkhover, Tais ; Andersson, Inger ; Hirsemann, Helmut ; Potdevin, Guillaume ; Graafsma, Heinz ; Nilsson, Björn ; Spence, John C. H.

Nature (London), 2011-02, Vol.470 (7332) [Periódico revisado por pares]

United States: Nature Publishing Group

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4
Time-resolved protein nanocrystallography using an X-ray free-electron laser
Time-resolved protein nanocrystallography using an X-ray free-electron laser
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Time-resolved protein nanocrystallography using an X-ray free-electron laser

Aquila, Andrew ; Hunter, Mark S ; Doak, R Bruce ; Kirian, Richard A ; Fromme, Petra ; White, Thomas A ; Andreasson, Jakob ; Arnlund, David ; Bajt, Saša ; Barends, Thomas RM ; Barthelmess, Miriam ; Bogan, Michael J ; Bostedt, Christoph ; Bottin, Hervé ; Bozek, John D ; Caleman, Carl ; Coppola, Nicola ; Davidsson, Jan ; DePonte, Daniel P ; Elser, Veit ; Epp, Sascha W ; Erk, Benjamin ; Fleckenstein, Holger ; Foucar, Lutz ; Frank, Matthias ; Fromme, Raimund ; Graafsma, Heinz ; Grotjohann, Ingo ; Gumprecht, Lars ; Hajdu, Janos ; Hampton, Christina Y ; Hartmann, Andreas ; Hartmann, Robert ; Hau-Riege, Stefan ; Hauser, Günter ; Hirsemann, Helmut ; Holl, Peter ; Holton, James M ; Hömke, André ; Johansson, Linda ; Kimmel, Nils ; Kassemeyer, Stephan ; Krasniqi, Faton ; Kühnel, Kai-Uwe ; Liang, Mengning ; Lomb, Lukas ; Malmerberg, Erik ; Marchesini, Stefano ; Martin, Andrew V ; Maia, Filipe RNC ; Messerschmidt, Marc ; Nass, Karol ; Reich, Christian ; Neutze, Richard ; Rolles, Daniel ; Rudek, Benedikt ; Rudenko, Artem ; Schlichting, Ilme ; Schmidt, Carlo ; Schmidt, Kevin E ; Schulz, Joachim ; Seibert, M Marvin ; Shoeman, Robert L ; Sierra, Raymond ; Soltau, Heike ; Starodub, Dmitri ; Stellato, Francesco ; Stern, Stephan ; Strüder, Lothar ; Timneanu, Nicusor ; Ullrich, Joachim ; Wang, Xiaoyu ; Williams, Garth J ; Weidenspointner, Georg ; Weierstall, Uwe ; Wunderer, Cornelia ; Barty, Anton ; Spence, John CH ; Chapman, Henry N

Optics Express, 2012-01, Vol.20 (3), p.2706-2716

eScholarship, University of California

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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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