Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Optical transition radiation used in the diagnostic of low energy and low current electron beams in particle acceleratorsTiago Fiorini da Silva Alfredo Luíz Bonini; Roberto da Rocha Lima; Nora Lia Maidana; Alexandre Almeida Malafronte; Paulo Reginaldo Pascholatti; Vito Roberto Vanin; Marcos Nogueira MartinsReview of Scientific Instruments Melville, NY v. 83, n.9, p. 093301/1-093301/7, 2012Melville 2012Item não circula. Consulte sua biblioteca.(Acessar) |
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2 |
Material Type: Artigo
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Low charge state lithium beam production from chemical compounds with laser ion sourceIkeda, Shunsuke ; Whelan, Tommy ; Tamis, Andrew ; Chalfin, Harry ; Cannavò, Antonino ; Kanesue, Takeshi ; Okamura, Masahiro ; Takahashi, KazumasaReview of scientific instruments, 2020-01, Vol.91 (1) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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3 |
Material Type: Artigo
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Development of highly efficient NEG pumping system for EBISKondrashev, Sergey ; Beebe, E. ; Coe, B. ; Ritter, J. ; Rodowicz, T. ; Schoepfer, R.Review of scientific instruments, 2019-11, Vol.90 (11) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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4 |
Material Type: Artigo
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Intense terahertz pulses from SLAC electron beams using coherent transition radiationWu, Ziran ; Fisher, Alan S ; Goodfellow, John ; Fuchs, Matthias ; Daranciang, Dan ; Hogan, Mark ; Loos, Henrik ; Lindenberg, AaronReview of scientific instruments, 2013-02, Vol.84 (2), p.022701-022701 [Periódico revisado por pares]United StatesTexto completo disponível |
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5 |
Material Type: Artigo
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First storage of ion beams in the Double Electrostatic Ion-Ring Experiment: DESIREESchmidt, H T ; Thomas, R D ; Gatchell, M ; Rosén, S ; Reinhed, P ; Löfgren, P ; Brännholm, L ; Blom, M ; Björkhage, M ; Bäckström, E ; Alexander, J D ; Leontein, S ; Hanstorp, D ; Zettergren, H ; Liljeby, L ; Källberg, A ; Simonsson, A ; Hellberg, F ; Mannervik, S ; Larsson, M ; Geppert, W D ; Rensfelt, K G ; Danared, H ; Paál, A ; Masuda, M ; Halldén, P ; Andler, G ; Stockett, M H ; Chen, T ; Källersjö, G ; Weimer, J ; Hansen, K ; Hartman, H ; Cederquist, HReview of scientific instruments, 2013-05, Vol.84 (5), p.055115-055115 [Periódico revisado por pares]United StatesTexto completo disponível |
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6 |
Material Type: Artigo
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Pulsed power technology based on semiconductor opening switches: A reviewRukin, S. N.Review of Scientific Instruments, 2020-01, Vol.91 (1), p.011501-011501 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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7 |
Material Type: Artigo
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Fast and efficient charge breeding of the Californium rare isotope breeder upgrade electron beam ion sourceOstroumov, P. N. ; Barcikowski, A. ; Dickerson, C. A. ; Perry, A. ; Pikin, A. I. ; Sharamentov, S. I. ; Vondrasek, R. C. ; Zinkann, G. P.Review of scientific instruments, 2015-08, Vol.86 (8) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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8 |
Material Type: Artigo
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Symmetric and asymmetric shocked gas jets for laser-plasmaexperimentsRovige, L ; Huijts, J ; Vernier, A ; Andriyash, I ; Sylla, F ; Tomkus, V ; Raciukaitis, G ; Dudutis, J ; Stankevic, V ; Gecys, P ; Faure, JReview of scientific instruments, 2021-08, Vol.92 (8) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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9 |
Material Type: Artigo
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Beam power scale-up in micro-electromechanical systems based multi-beam ion acceleratorsJi, Q. ; Afridi, K. K. ; Bauer, T. ; Giesbrecht, G. ; Hou, Y. ; Lal, A. ; Ni, D. ; Persaud, A. ; Qin, Z. ; Seidl, P. ; Sinha, S. ; Schenkel, T.Review of scientific instruments, 2021-10, Vol.92 (10), p.103301-103301 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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10 |
Material Type: Artigo
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Spectral encoding method for measuring the relative arrival time between x-ray/optical pulsesBionta, M. R. ; Hartmann, N. ; Weaver, M. ; French, D. ; Nicholson, D. J. ; Cryan, J. P. ; Glownia, J. M. ; Baker, K. ; Bostedt, C. ; Chollet, M. ; Ding, Y. ; Fritz, D. M. ; Fry, A. R. ; Kane, D. J. ; Krzywinski, J. ; Lemke, H. T. ; Messerschmidt, M. ; Schorb, S. ; Zhu, D. ; White, W. E. ; Coffee, R. N.Review of scientific instruments, 2014-08, Vol.85 (8), p.083116-083116 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |