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Selective Formation of Carbon Nanotubes and Its Application to Field-Emitter Arrays
Selective Formation of Carbon Nanotubes and Its Application to Field-Emitter Arrays
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Selective Formation of Carbon Nanotubes and Its Application to Field-Emitter Arrays

Do-Yoon Kim ; Jun Hee Choi ; Zoulkarneev, A.R. ; Min Ho Yang ; In Taek Han ; Ha Jin Kim ; Sun Il Kim ; Chan Wook Baik ; Jae-Hong Park ; Ji-Beom Yoo ; Jong Min Kim

IEEE electron device letters, 2009-07, Vol.30 (7), p.709-711 [Periódico revisado por pares]

New York, NY: IEEE

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2
Carbon nanotube field emitter arrays having an electron beam focusing structure
Carbon nanotube field emitter arrays having an electron beam focusing structure
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Carbon nanotube field emitter arrays having an electron beam focusing structure

Choi, Jun Hee ; Zoulkarneev, Andrei R. ; Jin, Yong Wan ; Park, Young Jun ; Chung, Deuk Seok ; Song, Byung Kwon ; Han, In Taek ; Lee, Hang Woo ; Park, Sang Hyun ; Kang, Ho Suk ; Kim, Ha Jong ; Kim, Jung Woo ; Jung, Jae Eun ; Kim, Jong Min ; Baek, Hong Gu ; Yu, Se Gi

Applied physics letters, 2004-02, Vol.84 (6), p.1022-1024 [Periódico revisado por pares]

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3
Optimization of electron beam focusing for gated carbon nanotube field emitter arrays
Optimization of electron beam focusing for gated carbon nanotube field emitter arrays
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Optimization of electron beam focusing for gated carbon nanotube field emitter arrays

Jun Hee Choi ; Zoulkarneev, A.R. ; Young-Jun Park ; Deuk Seok Chung ; Byung Kwon Song ; Ho Suk Kang ; Chan Wook Baik ; In Taek Han ; Ha Jin Kim ; Mun Jin Shin ; Ha Jong Kim ; Tae Shik Oh ; Yong Wan Jin ; Jong Min Kim ; Naesung Lee

IEEE transactions on electron devices, 2005-12, Vol.52 (12), p.2584-2590 [Periódico revisado por pares]

New York, NY: IEEE

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4
The influence of jet parameters on the accuracy of handedness measurements in the Pp-Collision at Energy 200 GeV/Nucleon
The influence of jet parameters on the accuracy of handedness measurements in the Pp-Collision at Energy 200 GeV/Nucleon
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The influence of jet parameters on the accuracy of handedness measurements in the Pp-Collision at Energy 200 GeV/Nucleon

Ivanshin, Yu. I. ; Minaev, N. G. ; Solovieva, T. M. ; Zoulkarneev, R. Ya

Czechoslovak journal of physics, 2001-01, Vol.51 (S1), p.A195-A199 [Periódico revisado por pares]

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5
High p{sub T} nonphotonic electron production in p+p collisions at {radical}(s)=200 GeV
High p{sub T} nonphotonic electron production in p+p collisions at {radical}(s)=200 GeV
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High p{sub T} nonphotonic electron production in p+p collisions at {radical}(s)=200 GeV

Agakishiev, H. ; Alakhverdyants, A. V. ; Averichev, G. S. ; Bunzarov, I. ; Dedovich, T. G. ; Efimov, L. G. ; Fedorisin, J. ; Filip, P. ; Kechechyan, A. ; Kizka, V. ; Lednicky, R. ; Panebratsev, Y. ; Rogachevskiy, O. V. ; Shahaliev, E. ; Tokarev, M. ; Vokal, S. ; Zoulkarneev, R. ; Zoulkarneeva, Y. ; Aggarwal, M. M. ; Bhati, A. K.

Physical review. D, Particles and fields, 2011-03, Vol.83 (5)

United States

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6
Optimization of electron beam focusing for CNT-FEDs
Optimization of electron beam focusing for CNT-FEDs
Material Type:
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Optimization of electron beam focusing for CNT-FEDs

Jun Hee Choi ; Zoulkarneev, A.R. ; Yong Wan Jin ; Young Jun Park ; Deuk Seok Chung ; Byung Kwon Song ; In Taek Han ; Ha Jin Kim ; Hang Woo Lee ; Sang Hyun Park ; Ho Suk Kang ; Mun Jin Shin ; Ha Jong Kim ; Kyung Won Min ; Jung Woo Kim ; Jae Eun Jung ; Jong Min Kim

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737), 2004, p.32-33

Piscataway NJ: IEEE

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7
Profile Simulation of Reactive Ion Etching for Silicon Tip-on-Post and Bottle-Neck Structures in Fed Applications
Profile Simulation of Reactive Ion Etching for Silicon Tip-on-Post and Bottle-Neck Structures in Fed Applications
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Profile Simulation of Reactive Ion Etching for Silicon Tip-on-Post and Bottle-Neck Structures in Fed Applications

Zoulkarneev, A. R. ; Kim, J. M. ; Hong, J. P. ; Choi, J. H. ; Michine, V. V.

MRS proceedings, 1997, Vol.471, Article 241

New York, USA: Cambridge University Press

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8
Calculation of Vacuum Conditions Inside a FED using a Monte-Carlo Method
Calculation of Vacuum Conditions Inside a FED using a Monte-Carlo Method
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Calculation of Vacuum Conditions Inside a FED using a Monte-Carlo Method

Zoulkarneev, A.R. ; Park, N.S. ; Hong, J.P. ; Kim, J.M.

10th International Conference on Vacuum Microelectronics, 1997, p.716-719

IEEE

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9
Simulation And Fabrication Of Spindt Type Field Emitter Arrays
Simulation And Fabrication Of Spindt Type Field Emitter Arrays
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Simulation And Fabrication Of Spindt Type Field Emitter Arrays

10th International Conference on Vacuum Microelectronics, 1997, p.401-406

IEEE

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10
Nearly single-crystalline GaN light-emitting diodes on amorphous glass substrates
Nearly single-crystalline GaN light-emitting diodes on amorphous glass substrates
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Nearly single-crystalline GaN light-emitting diodes on amorphous glass substrates

Choi, Jun Hee ; Zoulkarneev, Andrei ; Kim, Sun Il ; Baik, Chan Wook ; Yang, Min Ho ; Park, Sung Soo ; Suh, Hwansoo ; Kim, Un Jeong ; Bin Son, Hyung ; Lee, Jae Soong ; Kim, Miyoung ; Kim, Jong Min ; Kim, Kinam

Nature photonics, 2011-12, Vol.5 (12), p.763-769 [Periódico revisado por pares]

London: Nature Publishing Group

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