Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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The Capacity of Robust Private Information Retrieval With Colluding DatabasesSun, Hua ; Jafar, Syed AliIEEE transactions on information theory, 2018-04, Vol.64 (4), p.2361-2370 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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CID2013: A Database for Evaluating No-Reference Image Quality Assessment AlgorithmsVirtanen, Toni ; Nuutinen, Mikko ; Vaahteranoksa, Mikko ; Oittinen, Pirkko ; Hakkinen, JukkaIEEE transactions on image processing, 2015-01, Vol.24 (1), p.390-402 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Learning to Detect a Salient ObjectLiu, Tie ; Yuan, Zejian ; Sun, Jian ; Wang, Jingdong ; Zheng, Nanning ; Tang, Xiaoou ; Shum, Heung-YeungIEEE transactions on pattern analysis and machine intelligence, 2011-02, Vol.33 (2), p.353-367 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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MongoDB-Based Repository Design for IoT-Generated RFID/Sensor Big DataKang, Yong-Shin ; Park, Il-Ha ; Rhee, Jongtae ; Lee, Yong-HanIEEE sensors journal, 2016-01, Vol.16 (2), p.485-497 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Online Discovery of Gathering Patterns over TrajectoriesKai Zheng ; Yu Zheng ; Yuan, Nicholas J. ; Shuo Shang ; Xiaofang ZhouIEEE transactions on knowledge and data engineering, 2014-08, Vol.26 (8), p.1974-1988 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Supervised Learning of Semantic Classes for Image Annotation and RetrievalCarneiro, G. ; Chan, A.B. ; Moreno, P.J. ; Vasconcelos, N.IEEE transactions on pattern analysis and machine intelligence, 2007-03, Vol.29 (3), p.394-410 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Local Derivative Pattern Versus Local Binary Pattern: Face Recognition With High-Order Local Pattern DescriptorZhang, Baochang ; Gao, Yongsheng ; Zhao, Sanqiang ; Liu, JianzhuangIEEE transactions on image processing, 2010-02, Vol.19 (2), p.533-544 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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80 Million Tiny Images: A Large Data Set for Nonparametric Object and Scene RecognitionTorralba, A. ; Fergus, R. ; Freeman, W.T.IEEE transactions on pattern analysis and machine intelligence, 2008-11, Vol.30 (11), p.1958-1970 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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A Comprehensive Database for Benchmarking Imaging SystemsPanetta, Karen ; Wan, Qianwen ; Agaian, Sos ; Rajeev, Srijith ; Kamath, Shreyas ; Rajendran, Rahul ; Rao, Shishir Paramathma ; Kaszowska, Aleksandra ; Taylor, Holly A. ; Samani, Arash ; Yuan, XinIEEE transactions on pattern analysis and machine intelligence, 2020-03, Vol.42 (3), p.509-520 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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The UBIRIS.v2: A Database of Visible Wavelength Iris Images Captured On-the-Move and At-a-DistanceProenca, Hugo ; Filipe, Silvio ; Santos, Ricardo ; Oliveira, Joao ; Alexandre, Luis AIEEE transactions on pattern analysis and machine intelligence, 2010-08, Vol.32 (8), p.1529-1535 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |