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Material Type: Ata de Congresso
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Passive Cooling of Photovoltaics with DesiccantsSimpson, Lin J. ; Woods, Jason ; Valderrama, Nicolas ; Hill, Alex ; Vincent, Nina ; Silverman, Timothy2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.1893-1897IEEETexto completo disponível |
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Material Type: Ata de Congresso
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NREL Efforts to Address Soiling on PV ModulesSimpson, Lin J. ; Muller, Matthew ; Deceglie, Michael ; Moutinho, Helio ; Perkins, Craig ; Jiang, C. S. ; Miller, David C. ; Micheli, Leonardo ; Tamizhmani, Govindasamy ; Vasista Tatapudi, Sai Ravi ; Al-Jassim, Mowafak2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.2789-2793IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Thermal Management Research - from Power Electronics to PortablesJung, Ki Wook ; Zhang, Chi ; Liu, Tanya ; Asheghi, Mehdi ; Goodson, Kenneth E.2018 IEEE Symposium on VLSI Technology, 2018, p.17-18IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Experimental demonstration of differential synthetic aperture ladarBarber, Zeb W. ; Dahl, Jason R.2015 Conference on Lasers and Electro-Optics (CLEO), 2015, p.1-2OSATexto completo disponível |
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Material Type: Ata de Congresso
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Large Area Nanostructure Integration for Broad-Spectrum, Omnidirectional Antireflection Improvements on Polymer Packaged, Mechanically Flexible, Epitaxial Lift-Off III-V Solar CellsCossio, Gabriel ; Jihwan Lee ; Ragunathan, Gautham ; Wibowo, Andre ; Tatavarti, Sudersena Rao ; Sablon, Kimberly ; Yu, Edward T.2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.1181-1183IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Climbing Drum Peel (CDP) Test Method for Characterizing Adhesion in Flexible PV ModulesBheemreddy, Venkata ; Hardikar, Kedar2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.2688-2691IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Reliability of SiC power devices and its influence on their commercialization - review, status, and remaining issuesTreu, M ; Rupp, R ; Solkner, G2010 IEEE International Reliability Physics Symposium, 2010, p.156-161IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Power grid physics and implications for CADPant, Sanjay ; Chiprout, Eli2006 43rd ACM/IEEE Design Automation Conference, 2006, p.199-204New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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Total Dose Test Results for CubeSat ElectronicsAvery, K. ; Finchel, J. ; Mee, J. ; Kemp, W. ; Netzer, R. ; Elkins, D. ; Zufelt, B. ; Alexander, D.2011 IEEE Radiation Effects Data Workshop, 2011, p.1-8IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Dynamic compact thermal model of a packageMohammadi, F. ; Marami, M.2008 IEEE International Symposium on Circuits and Systems, 2008, p.2869-2872IEEETexto completo disponível |