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Refinado por: Base de dados/Biblioteca: EBSCOhost Computers and Applied Sciences Complete remover Base de dados/Biblioteca: Springer Nature - Springer Journals All 2022 remover
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1
Nanoedible films for food packaging: a review
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Nanoedible films for food packaging: a review

Jeevahan, Jeya ; Chandrasekaran, M.

Journal of materials science, 2019-10, Vol.54 (19), p.12290-12318 [Periódico revisado por pares]

New York: Springer US

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2
Antimicrobial activity of biocomposite films containing cellulose nanofibrils and ethyl lauroyl arginate
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Antimicrobial activity of biocomposite films containing cellulose nanofibrils and ethyl lauroyl arginate

Silva, Filomena ; Gracia, Nicolás ; McDonagh, Birgitte H. ; Domingues, Fernanda C. ; Nerín, Cristina ; Chinga-Carrasco, Gary

Journal of materials science, 2019-09, Vol.54 (18), p.12159-12170 [Periódico revisado por pares]

New York: Springer US

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3
Impact of Cu Pillar Bump Diameter and Solder Material on Reflow Soldering: A Computational Study with Thermal Fluid–Structure Interaction
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Impact of Cu Pillar Bump Diameter and Solder Material on Reflow Soldering: A Computational Study with Thermal Fluid–Structure Interaction

Lee, Jing Rou ; Abdul Aziz, Mohd Sharizal ; Khor, Chu Yee ; Ishak, Mohammad Hafifi Hafiz ; Kamarudin, Roslan ; Ani, F. Che

Journal of electronic materials, 2024-03, Vol.53 (3), p.1201-1213 [Periódico revisado por pares]

New York: Springer US

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4
In Situ Electrical Characterization of Transient Liquid-Phase Sintered Alloys
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In Situ Electrical Characterization of Transient Liquid-Phase Sintered Alloys

Nave, G. ; McCluskey, P.

Journal of electronic materials, 2024-03, Vol.53 (3), p.1239-1254 [Periódico revisado por pares]

New York: Springer US

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5
Interface reaction and intermetallic compound growth behavior of Sn-Ag-Cu lead-free solder joints on different substrates in electronic packaging
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Interface reaction and intermetallic compound growth behavior of Sn-Ag-Cu lead-free solder joints on different substrates in electronic packaging

Xiong, Ming-yue ; Zhang, Liang

Journal of materials science, 2019-01, Vol.54 (2), p.1741-1768 [Periódico revisado por pares]

New York: Springer US

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6
The Effects of Core–Shell-Structured SiO2@Ag Spheres in Enhancing the Performance of Ag-Flake-Filled Electrically Conductive Adhesive and Insight into the Conduction Mechanism
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The Effects of Core–Shell-Structured SiO2@Ag Spheres in Enhancing the Performance of Ag-Flake-Filled Electrically Conductive Adhesive and Insight into the Conduction Mechanism

Jiang, H. ; Zhou, M. B. ; Zhang, X. P.

Journal of electronic materials, 2024-03, Vol.53 (3), p.1272-1283 [Periódico revisado por pares]

New York: Springer US

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7
The Effect of Temperature on the Electrical Resistivity of Sn-Bi Alloys
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The Effect of Temperature on the Electrical Resistivity of Sn-Bi Alloys

Tan, Xin F. ; Hao, Qichao ; Zhou, Jiye ; McDonald, Stuart D. ; Sweatman, Keith ; Nogita, Kazuhiro

Journal of electronic materials, 2024-03, Vol.53 (3), p.1183-1191 [Periódico revisado por pares]

New York: Springer US

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8
The Interfacial Reaction of Ni/In/Ni Sandwich Structure During Solid-State Isothermal Aging
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The Interfacial Reaction of Ni/In/Ni Sandwich Structure During Solid-State Isothermal Aging

Wang, Yu-Chieh ; Ouyang, Fan-Yi

Journal of electronic materials, 2024-03, Vol.53 (3), p.1264-1271 [Periódico revisado por pares]

New York: Springer US

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9
Investigating the Effects of Rapid Precipitation of Bi in Sn on the Shear Strength of BGA Sn-Bi Alloys
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Investigating the Effects of Rapid Precipitation of Bi in Sn on the Shear Strength of BGA Sn-Bi Alloys

Hao, Qichao ; Tan, Xin F. ; McDonald, Stuart D. ; Sweatman, Keith ; Akaiwa, Tetsuya ; Nogita, Kazuhiro

Journal of electronic materials, 2024-03, Vol.53 (3), p.1223-1238 [Periódico revisado por pares]

New York: Springer US

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10
Whisker Growth in Sn Coatings: A Review of Current Status and Future Prospects
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Whisker Growth in Sn Coatings: A Review of Current Status and Future Prospects

Jagtap, Piyush ; Kumar, Praveen

Journal of electronic materials, 2021-03, Vol.50 (3), p.735-766 [Periódico revisado por pares]

New York: Springer US

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