Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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ExploreMaps: Efficient construction and ubiquitous exploration of panoramic view graphs of complex 3D environmentsDi Benedetto, M. ; Ganovelli, F. ; Balsa Rodriguez, M. ; Jaspe Villanueva, A. ; Scopigno, R. ; Gobbetti, E.Computer graphics forum, 2014-05, Vol.33 (2), p.459-468 [Periódico revisado por pares]Oxford: Blackwell Publishing LtdTexto completo disponível |
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2 |
Material Type: Artigo
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C-BDAM - Compressed Batched Dynamic Adaptive Meshes for Terrain RenderingGobbetti, E. ; Marton, F. ; Cignoni, P. ; Di Benedetto, M. ; Ganovelli, F.Computer graphics forum, 2006-09, Vol.25 (3), p.333-342 [Periódico revisado por pares]Oxford, UK and Boston, USA: Blackwell Publishing, IncTexto completo disponível |
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3 |
Material Type: Artigo
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Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS TechnologiesNarasimham, B. ; Bhuva, B.L. ; Schrimpf, R.D. ; Massengill, L.W. ; Gadlage, M.J. ; Amusan, O.A. ; Holman, W.T. ; Witulski, A.F. ; Robinson, W.H. ; Black, J.D. ; Benedetto, J.M. ; Eaton, P.H.IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2506-2511 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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UWB ranging accuracy in high- and low-data-rate applicationsCardinali, R. ; De Nardis, L. ; Di Benedetto, M.-G. ; Lombardo, P.IEEE transactions on microwave theory and techniques, 2006-04, Vol.54 (4), p.1865-1875 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Digital Single Event Transient Trends With Technology Node ScalingBenedetto, J.M. ; Eaton, P.H. ; Mavis, D.G. ; Gadlage, M. ; Turflinger, T.IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3462-3465 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Modeling and optimization of UWB communication networks through a flexible cost functionBaldi, P. ; De Nardis, L. ; Di Benedetto, M.-G.IEEE journal on selected areas in communications, 2002-12, Vol.20 (9), p.1733-1744 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Radiation effects and hardening of MOS technology: devices and circuitsHughes, H.L. ; Benedetto, J.M.IEEE transactions on nuclear science, 2003-06, Vol.50 (3), p.500-521 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS ProcessesNarasimham, B. ; Bhuva, B.L. ; Schrimpf, R.D. ; Massengill, L.W. ; Gadlage, M.J. ; Holman, T.W. ; Witulski, A.F. ; Robinson, W.H. ; Black, J.D. ; Benedetto, J.M. ; Eaton, P.H.IEEE transactions on nuclear science, 2008-06, Vol.55 (3), p.1708-1713 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Ray-Casted BlockMaps for Large Urban Models VisualizationCignoni, P. ; Di Benedetto, M. ; Ganovelli, F. ; Gobbetti, E. ; Marton, F. ; Scopigno, R.Computer graphics forum, 2007-09, Vol.26 (3), p.405-413 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
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10 |
Material Type: Artigo
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HBD layout isolation techniques for multiple node charge collection mitigationBlack, J.D. ; Sternberg, A.L. ; Alles, M.L. ; Witulski, A.F. ; Bhuva, B.L. ; Massengill, L.W. ; Benedetto, J.M. ; Baze, M.P. ; Wert, J.L. ; Hubert, M.G.IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2536-2541 [Periódico revisado por pares]New York: IEEETexto completo disponível |