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Characterization of Silicon Wafers with Combined Photocarrier Radiometry and Free Carrier Absorption
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Characterization of Silicon Wafers with Combined Photocarrier Radiometry and Free Carrier Absorption

Li, Bincheng ; Huang, Qiuping ; Ren, Shengdong

International journal of thermophysics, 2013-09, Vol.34 (8-9), p.1735-1745 [Periódico revisado por pares]

Boston: Springer US

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