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Characterization of Silicon Wafers with Combined Photocarrier Radiometry and Free Carrier AbsorptionLi, Bincheng ; Huang, Qiuping ; Ren, ShengdongInternational journal of thermophysics, 2013-09, Vol.34 (8-9), p.1735-1745 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |