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Refinado por: assunto: Physics remover assunto: Engineering remover autor: Gomès, Séverine remover nível superior: Recursos Online remover
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Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy
Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy
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Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy

Gomès, Séverine ; Newby, Pascal ; Canut, Bruno ; Termentzidis, Konstantinos ; Marty, Olivier ; Fréchette, Luc ; Chantrenne, Patrice ; Aimez, Vincent ; Bluet, Jean-Marie ; Lysenko, Vladimir

Microelectronics, 2013-11, Vol.44 (11), p.1029-1034

Elsevier Ltd

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Investigation of the thermal properties of thin solid materials at different temperature levels using a set of microresistors
Investigation of the thermal properties of thin solid materials at different temperature levels using a set of microresistors
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Investigation of the thermal properties of thin solid materials at different temperature levels using a set of microresistors

Assy, Ali ; Gomès, Séverine ; Chantrenne, Patrice ; Pavy, Nicolas ; Parasuraman, Jayalakshmi ; Kleber, Xavier ; Basset, Philippe

Microelectronics, 2014-05, Vol.45 (5), p.508-514

Elsevier Ltd

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