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Refinado por: Nome da Publicação: Journal Of Applied Physics remover
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11
Correlations between first-principles calculations and electric properties of HfO 2 :Al 2 O 3 alloys for metal–insulator–metal (MIM) capacitor applications
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Correlations between first-principles calculations and electric properties of HfO 2 :Al 2 O 3 alloys for metal–insulator–metal (MIM) capacitor applications

Khaldi, O. ; Jomni, F. ; Gonon, P.

Journal of applied physics, 2020-10, Vol.128 (13) [Periódico revisado por pares]

American Institute of Physics

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12
Gain dynamics in a CO 2 active medium optically pumped at 4.3 μ m
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Gain dynamics in a CO 2 active medium optically pumped at 4.3 μ m

Tovey, D. ; Pigeon, J. J. ; Tochitsky, S. Ya ; Louwrens, G. ; Ben-Zvi, I. ; Joshi, C. ; Martyshkin, D. ; Fedorov, V. ; Karki, K. ; Mirov, S.

Journal of applied physics, 2020-09, Vol.128 (10) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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13
Strain ratio effects in mechanical properties of supported thin films
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Strain ratio effects in mechanical properties of supported thin films

Godard, P. ; Faurie, D. ; Renault, P.

Journal of applied physics, 2020-03, Vol.127 (10) [Periódico revisado por pares]

American Institute of Physics

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14
Ge doped GaN and Al 0.5 Ga 0.5 N-based tunnel junctions on top of visible and UV light emitting diodes
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Ge doped GaN and Al 0.5 Ga 0.5 N-based tunnel junctions on top of visible and UV light emitting diodes

Fan Arcara, V. ; Damilano, B. ; Feuillet, G. ; Vezian, S. ; Ayadi, K. ; Chenot, S. ; Duboz, J.-Y.

Journal of applied physics, 2019-12, Vol.126 (22) [Periódico revisado por pares]

American Institute of Physics

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15
Radiation-induced micro-structures as ground states of a Swift-Hohenberg energy functional
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Radiation-induced micro-structures as ground states of a Swift-Hohenberg energy functional

Simeone, David ; Thorogood, G J ; Murphy, G L ; Forestier, A ; Garcia, P ; Luneville, L

Journal of applied physics, 2019-02, Vol.125 [Periódico revisado por pares]

American Institute of Physics

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16
Resistive switching study in HfO 2 based resistive memories by conductive atomic force microscopy in vacuum
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Resistive switching study in HfO 2 based resistive memories by conductive atomic force microscopy in vacuum

Singh, A. ; Blonkowski, S. ; Kogelschatz, M.

Journal of applied physics, 2018-07, Vol.124 (1) [Periódico revisado por pares]

American Institute of Physics

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17
Structural effects in the interstitial solid solution system (La,Ce)(Fe,Si) 13 C x -H: Correlation with hydrogenation kinetics
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Structural effects in the interstitial solid solution system (La,Ce)(Fe,Si) 13 C x -H: Correlation with hydrogenation kinetics

Hai, X. ; Porcher, F. ; Mayer, C. ; Miraglia, S.

Journal of applied physics, 2018-02, Vol.123 (8) [Periódico revisado por pares]

American Institute of Physics

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18
Inducing conductivity in polycrystalline ZnO 1- x thin films through space charge doping
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Inducing conductivity in polycrystalline ZnO 1- x thin films through space charge doping

Paradisi, Andrea ; Biscaras, Johan ; Shukla, Abhay

Journal of applied physics, 2017-09, Vol.122 (9) [Periódico revisado por pares]

American Institute of Physics

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19
Atomistic mechanisms of copper filament formation and composition in $Al_{2}$$ O_{3}$ -based conductive bridge random access memory
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Atomistic mechanisms of copper filament formation and composition in $Al_{2}$$ O_{3}$ -based conductive bridge random access memory

Nail, C. ; Blaise, P. ; Molas, G. ; Bernard, M. C. ; Roule, A. ; Toffoli, A. ; Perniola, L. ; Vallee, C.

Journal of applied physics, 2017-07, Vol.122 (2) [Periódico revisado por pares]

American Institute of Physics

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20
Interface-mediated ferroelectric patterning and Mn valency in nano-structured PbTiO 3 /La 0.7 Sr 0.3 MnO 3
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Interface-mediated ferroelectric patterning and Mn valency in nano-structured PbTiO 3 /La 0.7 Sr 0.3 MnO 3

Krug, Ingo P. ; Doganay, Hatice ; Nickel, Nick ; Gottlob, Daniel M. ; Schneider, Claus M. ; Morelli, Alessio ; Preziosi, Daniele ; Lindfors-Vrejoiu, Ionela ; Laskowski, Robert ; Barrett, Nick

Journal of applied physics, 2016-09, Vol.120 (9) [Periódico revisado por pares]

American Institute of Physics

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