Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Remote Sensing Image Scene Classification Meets Deep Learning: Challenges, Methods, Benchmarks, and OpportunitiesCheng, Gong ; Xie, Xingxing ; Han, Junwei ; Guo, Lei ; Xia, Gui-SongIEEE journal of selected topics in applied earth observations and remote sensing, 2020, Vol.13, p.3735-3756 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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EuroSAT: A Novel Dataset and Deep Learning Benchmark for Land Use and Land Cover ClassificationHelber, Patrick ; Bischke, Benjamin ; Dengel, Andreas ; Borth, DamianIEEE journal of selected topics in applied earth observations and remote sensing, 2019-07, Vol.12 (7), p.2217-2226 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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DASNet: Dual Attentive Fully Convolutional Siamese Networks for Change Detection in High-Resolution Satellite ImagesChen, Jie ; Yuan, Ziyang ; Peng, Jian ; Chen, Li ; Huang, Haozhe ; Zhu, Jiawei ; Liu, Yu ; Li, HaifengIEEE journal of selected topics in applied earth observations and remote sensing, 2021, Vol.14, p.1194-1206 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Google Earth Engine Cloud Computing Platform for Remote Sensing Big Data Applications: A Comprehensive ReviewAmani, Meisam ; Ghorbanian, Arsalan ; Ahmadi, Seyed Ali ; Kakooei, Mohammad ; Moghimi, Armin ; Mirmazloumi, S. Mohammad ; Moghaddam, Sayyed Hamed Alizadeh ; Mahdavi, Sahel ; Ghahremanloo, Masoud ; Parsian, Saeid ; Wu, Qiusheng ; Brisco, BrianIEEE journal of selected topics in applied earth observations and remote sensing, 2020, Vol.13, p.5326-5350 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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A Multiscale and Multidepth Convolutional Neural Network for Remote Sensing Imagery Pan-SharpeningYuan, Qiangqiang ; Wei, Yancong ; Meng, Xiangchao ; Shen, Huanfeng ; Zhang, LiangpeiIEEE journal of selected topics in applied earth observations and remote sensing, 2018-03, Vol.11 (3), p.978-989 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Support Vector Machine Versus Random Forest for Remote Sensing Image Classification: A Meta-Analysis and Systematic ReviewSheykhmousa, Mohammadreza ; Mahdianpari, Masoud ; Ghanbari, Hamid ; Mohammadimanesh, Fariba ; Ghamisi, Pedram ; Homayouni, SaeidIEEE journal of selected topics in applied earth observations and remote sensing, 2020, Vol.13, p.6308-6325 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Spectral-Spatial Classification of Hyperspectral Data Based on Deep Belief NetworkChen, Yushi ; Zhao, Xing ; Jia, XiupingIEEE journal of selected topics in applied earth observations and remote sensing, 2015-06, Vol.8 (6), p.2381-2392 [Periódico revisado por pares]IEEETexto completo disponível |
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8 |
Material Type: Artigo
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YOLOv5-Tassel: Detecting Tassels in RGB UAV Imagery With Improved YOLOv5 Based on Transfer LearningLiu, Wei ; Quijano, Karoll ; Crawford, Melba M.IEEE journal of selected topics in applied earth observations and remote sensing, 2022, Vol.15, p.8085-8094 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Deep Learning-Based Classification of Hyperspectral DataChen, Yushi ; Lin, Zhouhan ; Zhao, Xing ; Wang, Gang ; Gu, YanfengIEEE journal of selected topics in applied earth observations and remote sensing, 2014-06, Vol.7 (6), p.2094-2107 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Hyperspectral Image Classification-Traditional to Deep Models: A Survey for Future ProspectsAhmad, Muhammad ; Shabbir, Sidrah ; Roy, Swalpa Kumar ; Hong, Danfeng ; Wu, Xin ; Yao, Jing ; Khan, Adil Mehmood ; Mazzara, Manuel ; Distefano, Salvatore ; Chanussot, JocelynIEEE journal of selected topics in applied earth observations and remote sensing, 2022, Vol.15, p.968-999 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |