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Refinado por: Base de dados/Biblioteca: SPIE Digital Library (Journals) remover tipo de recurso: Anais de Congresso remover
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1
Nanoparticles for enhanced contrast optical coherence tomography
Nanoparticles for enhanced contrast optical coherence tomography
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Nanoparticles for enhanced contrast optical coherence tomography

Maule, César D ; Quaresma, Pedro ; Carvalho, Patrícia A ; Jorge, Pedro ; Pereira, Eulália ; Rosa, Carla C

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.7139, p.71390V-71390V-6

Bellingham, Wash: SPIE

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2
Preliminary results of a computerized Placido disk surgical corneal topographer
Preliminary results of a computerized Placido disk surgical corneal topographer
Material Type:
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Preliminary results of a computerized Placido disk surgical corneal topographer

Carvalho, Luis A ; Tonissi, S. A ; Castro, Jarbas C

SPIE proceedings series, 1999, Vol.3591, p.53-62

Bellingham WA: SPIE

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3
Measurement and stitching of regular cloud of points
Measurement and stitching of regular cloud of points
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Measurement and stitching of regular cloud of points

Fantin, A. V ; Pinto, T. L ; de Carvalho, C. A ; Albertazzi, A

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.7066, p.706607-706607-11

Bellingham, Wash: SPIE

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4
On the absolute accuracy of Zernike polynomials to characterize the corneal surface and the optical aberrations of the human eye
On the absolute accuracy of Zernike polynomials to characterize the corneal surface and the optical aberrations of the human eye
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

On the absolute accuracy of Zernike polynomials to characterize the corneal surface and the optical aberrations of the human eye

Carvalho, Luis A

Proceedings of SPIE, the International Society for Optical Engineering, 2005, Vol.5772, p.181-192

Bellingham, Washington: SPIE

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5
Influence of processing parameters on the thickness of sol-gel silica films
Influence of processing parameters on the thickness of sol-gel silica films
Material Type:
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Influence of processing parameters on the thickness of sol-gel silica films

Matos, M. C ; Carvalho, Alvaro M ; Almeida, Rui M ; Ilharco, Laura M

SPIE 1992

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6
Criteria of quality in tasks of optical system optimization
Criteria of quality in tasks of optical system optimization
Material Type:
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Criteria of quality in tasks of optical system optimization

Smirnov, Alexandre J ; Pacheco de Carvalho, J. A. R

SPIE 1999

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7
Dynamic aberration measurement in Earth observation adaptive optics systems
Dynamic aberration measurement in Earth observation adaptive optics systems
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Dynamic aberration measurement in Earth observation adaptive optics systems

Smirnov, Alexandre J ; Pacheco de Carvalho, J. A. R ; Utkin, Andrei B

SPIE 1998

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8
Clinical experience of PDT in Brazil: a 300 patient overview
Clinical experience of PDT in Brazil: a 300 patient overview
Material Type:
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Clinical experience of PDT in Brazil: a 300 patient overview

Kurachi, Cristina ; Ferreira, Juliana ; Marcassa, Luis G ; Cestari Filho, Guilherme A ; Souza, Cacilda S ; Bagnato, Vanderlei S

Proc. SPIE, 2005, Vol.5689, p.218-226

SPIE

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9
Chemical sensing with an all-fiber reflection LSPR sensor
Chemical sensing with an all-fiber reflection LSPR sensor
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Chemical sensing with an all-fiber reflection LSPR sensor

Gouvêa, Paula M. P ; Parra, Dario P ; Braga, Arthur M. B ; Carvalho, Isabel C. S

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.7753, p.77530Z-77530Z-4

Bellingham WA: SPIE

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10
AlN antiresonant layer ARROW waveguides
AlN antiresonant layer ARROW waveguides
Material Type:
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AlN antiresonant layer ARROW waveguides

Pelegrini, M. V ; Carvalho, D. O ; Alayo, M. I ; Pereyra, I

SPIE 2010

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