Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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A Modelisation of the temperature dependence of the Fowler–Nordheim current in EEPROM memoriesRoca, M. ; Laffont, R. ; Micolau, G. ; Lalande, F. ; Pizzuto, O.Microelectronics and reliability, 2009-09, Vol.49 (9), p.1070-1073 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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2 |
Material Type: Artigo
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Leakage paths identification in NVM using biased data retentionPostel-Pellerin, J. ; Laffont, R. ; Micolau, G. ; Lalande, F. ; Regnier, A. ; Bouteille, B.Microelectronics and reliability, 2010-09, Vol.50 (9), p.1474-1478 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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3 |
Material Type: Artigo
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New EEPROM concept for single bit operationRaguet, J.R. ; Laffont, R. ; Bouchakour, R. ; Bidal, V. ; Regnier, A. ; Mirabel, J.M.Solid-state electronics, 2008-10, Vol.52 (10), p.1525-1529 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
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4 |
Material Type: Artigo
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Tunneling injection temperature dependence in EEPROM cellZahi, Y. ; Laffont, R. ; Lalande, F. ; Boutahar, S. ; Bouchakour, R.Journal of non-crystalline solids, 2007-04, Vol.353 (5), p.648-652 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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5 |
Material Type: Artigo
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An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention testLe Roux, C. ; Lopez, L. ; Firiti, A. ; Ogier, J.L. ; Lalande, F. ; Laffont, R. ; Micolau, G.Solid-state electronics, 2008-10, Vol.52 (10), p.1550-1554 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
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6 |
Material Type: Artigo
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An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problemMicolau, G. ; Postel-Pellerin, J. ; Laffont, R. ; Lalande, F. ; Le Roux, C. ; Ogier, J.-L.Inverse problems in science and engineering, 2011-12, Vol.19 (8), p.1043-1062 [Periódico revisado por pares]Abingdon: Taylor & FrancisTexto completo disponível |
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7 |
Material Type: Artigo
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A new method to quantify retention-failed cells of an EEPROM CASTLe Roux, C. ; Lopez, L. ; Firiti, A. ; Ogier, J.L. ; Lalande, F. ; Laffont, R. ; Micolau, G.Microelectronics and reliability, 2007-09, Vol.47 (9), p.1609-1613 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
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8 |
Material Type: Artigo
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A new architecture of dual control gate EEPROMRegnier, A. ; Laffont, R. ; Bouchakour, R. ; Mirabel, J.M.Journal of non-crystalline solids, 2005-07, Vol.351 (21), p.1906-1910 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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A new floating gate compact model applied to flash memory cellLaffont, R. ; Masson, P. ; Bernardini, S. ; Bouchakour, R. ; Mirabel, J.M.Journal of non-crystalline solids, 2003-07, Vol.322 (1), p.250-255 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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10 |
Material Type: Ata de Congresso
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New Fowler Nordheim current determination in EEPROM cell from transient measurementsLaffont, R. ; Masson, P. ; Canet, P. ; Delsuc, B. ; Bouchakour, R. ; Mirabel, J.M.ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003, 2003, p.71-74IEEETexto completo disponível |