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Multilingual Dictionary of Nuclear Reactor Physics and Engineering
Multilingual Dictionary of Nuclear Reactor Physics and Engineering
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Multilingual Dictionary of Nuclear Reactor Physics and Engineering

Anglart, Henryk

Milton: CRC Press 2021

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2
A simulation study of temperature effects on performance parameters of silicon heterojunction solar cells with different ITO/a-Si:H selective contacts
A simulation study of temperature effects on performance parameters of silicon heterojunction solar cells with different ITO/a-Si:H selective contacts
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A simulation study of temperature effects on performance parameters of silicon heterojunction solar cells with different ITO/a-Si:H selective contacts

Opto-electronics review, 2022-01 [Periódico revisado por pares]

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3
Grating-free high-x InP/InxGa1-xAs mid-wavelength infrared QWIP focal plane array
Grating-free high-x InP/InxGa1-xAs mid-wavelength infrared QWIP focal plane array
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Grating-free high-x InP/InxGa1-xAs mid-wavelength infrared QWIP focal plane array

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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4
A review of the current state-of-the-art in Fano resonance-based plasmonic metal-insulator-metal waveguides for sensing applications
A review of the current state-of-the-art in Fano resonance-based plasmonic metal-insulator-metal waveguides for sensing applications
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A review of the current state-of-the-art in Fano resonance-based plasmonic metal-insulator-metal waveguides for sensing applications

Opto-electronics review, 2021-01 [Periódico revisado por pares]

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5
Testing surveillance thermal imagers under simulated real work conditions
Testing surveillance thermal imagers under simulated real work conditions
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Testing surveillance thermal imagers under simulated real work conditions

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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6
Two-step etch in n-on-p type-II superlattices for surface leakage reduction in mid-wave infrared megapixel detectors
Two-step etch in n-on-p type-II superlattices for surface leakage reduction in mid-wave infrared megapixel detectors
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Two-step etch in n-on-p type-II superlattices for surface leakage reduction in mid-wave infrared megapixel detectors

Ramos Santesmases, David ; Delmas, Marie ; Ivanov, Ruslan ; Zurauskaite, Laura ; Evans, Dean ; Almqvist, Susanne ; Becanovic, Smilja ; Hellström, Per-Erik ; Costard, Eric ; Hoglund, Linda

Opto-electronics review, 2023-01, Vol.31 (1) [Periódico revisado por pares]

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7
Selected issues concerning the influence of irradiation on the characteristics of superconducting elements in modern FELs facilities
Selected issues concerning the influence of irradiation on the characteristics of superconducting elements in modern FELs facilities
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Selected issues concerning the influence of irradiation on the characteristics of superconducting elements in modern FELs facilities

Sosnowski, Jacek

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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8
Cost-effective titania layers over 100 nm thick – effect of annealing on the structural, morphological, and optical properties
Cost-effective titania layers over 100 nm thick – effect of annealing on the structural, morphological, and optical properties
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Cost-effective titania layers over 100 nm thick – effect of annealing on the structural, morphological, and optical properties

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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9
Carrier concentration and in-plane mobility in both non-intentionally and Si-doped InAsSb and InAs/InAsSb type-II superlattice materials for space-based infrared detectors
Carrier concentration and in-plane mobility in both non-intentionally and Si-doped InAsSb and InAs/InAsSb type-II superlattice materials for space-based infrared detectors
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Carrier concentration and in-plane mobility in both non-intentionally and Si-doped InAsSb and InAs/InAsSb type-II superlattice materials for space-based infrared detectors

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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10
A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty
A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty
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A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty

Opto-electronics review, 2023-01 [Periódico revisado por pares]

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