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Refinado por: Base de dados/Biblioteca: IEEE Electronic Library (IEL) Conference Proceedings remover tipo de recurso: Anais de Congresso remover
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1
Research on product common attribute model with consumption value theory applied in food industry
Research on product common attribute model with consumption value theory applied in food industry
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Research on product common attribute model with consumption value theory applied in food industry

Chen, T.-Y ; Liu, Y.-C ; Chen, Y.-M

2013 IEEE International Conference on Industrial Engineering and Engineering Management, 2013, p.447-451

IEEE

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2
Galloping amplitude analysis and observation on full-scale test overhead transmission lines
Galloping amplitude analysis and observation on full-scale test overhead transmission lines
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Galloping amplitude analysis and observation on full-scale test overhead transmission lines

Liu, Y. K. ; Fu, Z. C. ; Yang, X. H.

2015 IEEE Power & Energy Society General Meeting, 2015, p.1-5

IEEE

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3
Frequency domain limitations of non-negative impulse response non-lowpass filters
Frequency domain limitations of non-negative impulse response non-lowpass filters
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Frequency domain limitations of non-negative impulse response non-lowpass filters

Liu, Y ; Bauer, Peter H.

2010 IEEE International Symposium on Circuits and Systems (ISCAS), 2010, p.721-724

IEEE

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4
Analysing Frequency Support from DFIG-based Wind Turbines - Impact of Parameters and Initial Conditions
Analysing Frequency Support from DFIG-based Wind Turbines - Impact of Parameters and Initial Conditions
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Analysing Frequency Support from DFIG-based Wind Turbines - Impact of Parameters and Initial Conditions

Krpan, M ; Kuzle, I ; Liu, Y

IET Conference Proceedings, 2018, p.98

Stevenage, UK: IET

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5
Multisensory five-finger dexterous hand: The DLR/HIT Hand II
Multisensory five-finger dexterous hand: The DLR/HIT Hand II
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Multisensory five-finger dexterous hand: The DLR/HIT Hand II

Liu, H. ; Wu, K. ; Meusel, P. ; Seitz, N. ; Hirzinger, G. ; Jin, M.H. ; Liu, Y.W. ; Fan, S.W. ; Lan, T. ; Chen, Z.P.

2008 IEEE/RSJ International Conference on Intelligent Robots and Systems, 2008, p.3692-3697

IEEE

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6
Temperature Effect Kron-Branin Model of Tree Microstrip Interconnects
Temperature Effect Kron-Branin Model of Tree Microstrip Interconnects
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Temperature Effect Kron-Branin Model of Tree Microstrip Interconnects

Xu, Z. ; Liu, Y. ; Ravelo, B.

2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), 2018, p.457-462

IEEE

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7
A distributed approach to solving overlay mismatching problem
A distributed approach to solving overlay mismatching problem
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A distributed approach to solving overlay mismatching problem

Liu, Y. ; Zhuang, Z. ; Xiao, L. ; Ni, L.M.

24th International Conference on Distributed Computing Systems, 2004. Proceedings, 2004, p.132-139

Los Alamitos CA: IEEE

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8
Test structures for characterising the integration of EWOD and SAW technologies for microfluidics
Test structures for characterising the integration of EWOD and SAW technologies for microfluidics
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Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

Li, Y ; Fu, Y Q ; Flynn, B W ; Parkes, W ; Liu, Y ; Brodie, S ; Terry, J G ; Haworth, L I ; Bunting, A S ; Stevenson, J T M ; Smith, S ; Walton, A J

2010 International Conference on Microelectronic Test Structures (ICMTS), 2010, p.52-57

IEEE

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9
A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices
A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices
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A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices

Chung, S.S. ; Liu, Y.R. ; Yeh, C.F. ; Wu, S.R. ; Lai, C.S. ; Chang, T.Y. ; Ho, J.H. ; Liu, C.Y. ; Huang, C.T. ; Tsai, C.T.

Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005, 2005, p.86-87

IEEE

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10
Survivability analysis of telephone access network
Survivability analysis of telephone access network
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Survivability analysis of telephone access network

Liu, Y. ; Mendiratta, V.B. ; Trivedi, K.S.

15th International Symposium on Software Reliability Engineering, 2004, p.367-377

Los Alamitos CA: IEEE

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