Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Dissertação de Mestrado
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Investigação da consistência termodinâmica do conceito de temperaturas negativasInagaki, João Hiroyuki De MeloBiblioteca Digital de Teses e Dissertações da USP; Universidade de São Paulo; Instituto de Física de São Carlos 2023-08-23Acesso online. A biblioteca também possui exemplares impressos. |
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2 |
Material Type: Artigo
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Ferrite-based room temperature negative temperature coefficient printed thermistorsMcGhee, J.R ; Sagu, J.S ; Southee, D.J ; Evans, P.S.A ; Wijayantha, K.G.UElectronics letters, 2020-11, Vol.56 (24), p.1322-1324 [Periódico revisado por pares]The Institution of Engineering and TechnologyTexto completo disponível |
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3 |
Material Type: Artigo
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BTI Analysis Tool-Modeling of NBTI DC, AC Stress and Recovery Time Kinetics, Nitrogen Impact, and EOL EstimationParihar, Narendra ; Goel, Nilesh ; Mukhopadhyay, Subhadeep ; Mahapatra, SouvikIEEE transactions on electron devices, 2018-02, Vol.65 (2), p.392-403 [Periódico revisado por pares]IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC-AC Experimental ConditionsParihar, Narendra ; Sharma, Uma ; Southwick, Richard G. ; Wang, Miaomiao ; Stathis, James H. ; Mahapatra, SouvikIEEE transactions on electron devices, 2018-01, Vol.65 (1), p.23-30 [Periódico revisado por pares]IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Inkjet Printing of Perovskites for Breaking Performance–Temperature Tradeoffs in Fabric‐Based ThermistorsLi, Shujie ; Kosek, Alex ; Jahangir, Mohammad Naim ; Malhotra, Rajiv ; Chang, Chih‐HungAdvanced functional materials, 2021-01, Vol.31 (1), p.2006273-n/a [Periódico revisado por pares]Hoboken: Wiley Subscription Services, IncTexto completo disponível |
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6 |
Material Type: Artigo
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A Simulation Study of NBTI Impact on 14-nm Node FinFET Technology for Logic Applications: Device Degradation to Circuit-Level InteractionMishra, Subrat ; Amrouch, Hussam ; Joe, Jerin ; Dabhi, Chetan K. ; Thakor, Karansingh ; Chauhan, Yogesh S. ; Henkel, Jorg ; Mahapatra, SouvikIEEE transactions on electron devices, 2019-01, Vol.66 (1), p.271-278 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by ExtrapolationRui Gao ; Manut, Azrif B. ; Zhigang Ji ; Jigang Ma ; Meng Duan ; Jian Fu Zhang ; Franco, Jacopo ; Hatta, Sharifah Wan Muhamad ; Wei Dong Zhang ; Kaczer, Ben ; Vigar, David ; Linten, Dimitri ; Groeseneken, GuidoIEEE transactions on electron devices, 2017-04, Vol.64 (4), p.1467-1473 [Periódico revisado por pares]IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Recovery Behavior of Interface Traps After Negative Bias Temperature Instability Stress in p-FinFETs Featuring Fast Trap Characterization TechniqueZhou, Longda ; Zhang, Qingzhu ; Yang, Hong ; Ji, Zhigang ; Wang, Guilei ; Liu, Qianqian ; Tang, Bo ; Gao, Rui ; Simoen, Eddy ; Yin, Huaxiang ; Zhao, Chao ; Du, Anyan ; Luo, Jun ; Wang, WenwuIEEE transactions on electron devices, 2021-09, Vol.68 (9), p.4251-4258 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Origin and reactivity of hot-spots in end-gas autoignition with effects of negative temperature coefficients: Relevance to pressure wave developmentsTerashima, Hiroshi ; Matsugi, Akira ; Koshi, MitsuoCombustion and flame, 2017-10, Vol.184, p.324-334 [Periódico revisado por pares]New York: Elsevier IncTexto completo disponível |
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10 |
Material Type: Artigo
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New Insight Into Negative Bias Temperature Instability Degradation During Self-Heating in Nanoscale Bulk FinFETsSon, Dokyun ; Hong, Kyushik ; Shim, Hyewon ; Pae, Sangwoo ; Shin, HyungcheolIEEE electron device letters, 2019-09, Vol.40 (9), p.1354-1357 [Periódico revisado por pares]New York: IEEETexto completo disponível |