1
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Material Type: Artigo
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The Effect of Sputtering Conditions on Submicron Contact Filling Using Laser Planarization
Yu, C. ; Doan, T.T. ; Kim, S. ; Sandhu, G.S.
MRS proceedings, 1990, Vol.203, Article 357
New York, USA: Cambridge University Press
Sem texto completo
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2
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Material Type: Artigo
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Depth Oscillations of Planar Channeling Yields in InP and GaP for Lattice Location Applications
Swanson, M.L. ; Parikh, N.R. ; Sandhu, G.S. ; Frey, E.C. ; Zhanc, Z.H. ; Chu, W.K.
MRS proceedings, 1988, Vol.144, Article 409
New York, USA: Cambridge University Press
Sem texto completo
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3
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Material Type: Artigo
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RBS/Channelinc and Tem Analysis of Thin Sandwiched EPI-Layers of Germanium on Silicon
Swanson, M.L. ; Parikh, N.R. ; Frey, E.C. ; Sandhu, G.S. ; Chu, W.K. ; Baribeau Kechang, J.-M. ; Mccaffrey, J. ; Jackman, T.E.
MRS proceedings, 1988, Vol.138, Article 581
New York, USA: Cambridge University Press
Sem texto completo
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