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Refinado por: Base de dados/Biblioteca: Cambridge Journals remover
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1
The Effect of Sputtering Conditions on Submicron Contact Filling Using Laser Planarization
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The Effect of Sputtering Conditions on Submicron Contact Filling Using Laser Planarization

Yu, C. ; Doan, T.T. ; Kim, S. ; Sandhu, G.S.

MRS proceedings, 1990, Vol.203, Article 357

New York, USA: Cambridge University Press

Sem texto completo

2
Depth Oscillations of Planar Channeling Yields in InP and GaP for Lattice Location Applications
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Depth Oscillations of Planar Channeling Yields in InP and GaP for Lattice Location Applications

Swanson, M.L. ; Parikh, N.R. ; Sandhu, G.S. ; Frey, E.C. ; Zhanc, Z.H. ; Chu, W.K.

MRS proceedings, 1988, Vol.144, Article 409

New York, USA: Cambridge University Press

Sem texto completo

3
RBS/Channelinc and Tem Analysis of Thin Sandwiched EPI-Layers of Germanium on Silicon
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Artigo
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RBS/Channelinc and Tem Analysis of Thin Sandwiched EPI-Layers of Germanium on Silicon

Swanson, M.L. ; Parikh, N.R. ; Frey, E.C. ; Sandhu, G.S. ; Chu, W.K. ; Baribeau Kechang, J.-M. ; Mccaffrey, J. ; Jackman, T.E.

MRS proceedings, 1988, Vol.138, Article 581

New York, USA: Cambridge University Press

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