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Refinado por: Base de dados/Biblioteca: Aluminium Industry Abstracts remover Nome da Publicação: Review Of Scientific Instruments remover assunto: Technology remover
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1
Plasma-accelerated flyer-plates for equation of state studies
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Plasma-accelerated flyer-plates for equation of state studies

Fratanduono, D E ; Smith, R F ; Boehly, T R ; Eggert, J H ; Braun, D G ; Collins, G W

Review of scientific instruments, 2012-07, Vol.83 (7), p.073504-073504 [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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2
Aerodynamic levitator furnace for measuring thermophysical properties of refractory liquids
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Aerodynamic levitator furnace for measuring thermophysical properties of refractory liquids

Langstaff, D ; Gunn, M ; Greaves, G N ; Marsing, A ; Kargl, F

Review of scientific instruments, 2013-12, Vol.84 (12), p.124901-124901 [Periódico revisado por pares]

United States: American Institute of Physics

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3
A 4 MA, 500 ns pulsed power generator CQ-4 for characterization of material behaviors under ramp wave loading
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A 4 MA, 500 ns pulsed power generator CQ-4 for characterization of material behaviors under ramp wave loading

Wang, Guiji ; Luo, Binqiang ; Zhang, Xuping ; Zhao, Jianheng ; Sun, Chengwei ; Tan, Fuli ; Chong, Tao ; Mo, Jianjun ; Wu, Gang ; Tao, Yanhui

Review of scientific instruments, 2013-01, Vol.84 (1), p.015117-015117 [Periódico revisado por pares]

United States

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4
A compact and efficient strontium oven for laser-cooling experiments
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A compact and efficient strontium oven for laser-cooling experiments

Schioppo, M ; Poli, N ; Prevedelli, M ; Falke, St ; Lisdat, Ch ; Sterr, U ; Tino, G M

Review of scientific instruments, 2012-10, Vol.83 (10), p.103101-103101 [Periódico revisado por pares]

United States

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5
High passive-stability diode-laser design for use in atomic-physics experiments
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High passive-stability diode-laser design for use in atomic-physics experiments

Cook, Eryn C ; Martin, Paul J ; Brown-Heft, Tobias L ; Garman, Jeffrey C ; Steck, Daniel A

Review of scientific instruments, 2012-04, Vol.83 (4), p.043101-043101-9 [Periódico revisado por pares]

United States: American Institute of Physics

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6
Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility
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Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility

Gupta, Y M ; Turneaure, Stefan J ; Perkins, K ; Zimmerman, K ; Arganbright, N ; Shen, G ; Chow, P

Rev. Sci. Instrum, 2012-12, Vol.83 (12), p.123905-123905 [Periódico revisado por pares]

United States

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7
A two degree of freedom micro-gripper with grasping and rotating functions for optical fibers assembling
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A two degree of freedom micro-gripper with grasping and rotating functions for optical fibers assembling

Chen, Weihai ; Shi, Xiaohui ; Chen, Wenjie ; Zhang, Jianbin

Review of scientific instruments, 2013-11, Vol.84 (11), p.115111-115111 [Periódico revisado por pares]

United States: American Institute of Physics

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8
A neutron diagnostic for high current deuterium beams
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A neutron diagnostic for high current deuterium beams

Rebai, M ; Cavenago, M ; Croci, G ; Dalla Palma, M ; Gervasini, G ; Ghezzi, F ; Grosso, G ; Murtas, F ; Pasqualotto, R ; Perelli Cippo, E ; Tardocchi, M ; Tollin, M ; Gorini, G

Review of scientific instruments, 2012-02, Vol.83 (2), p.02B721-02B721-3 [Periódico revisado por pares]

United States: American Institute of Physics

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9
The Oxford-Diamond In Situ Cell for studying chemical reactions using time-resolved X-ray diffraction
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The Oxford-Diamond In Situ Cell for studying chemical reactions using time-resolved X-ray diffraction

Moorhouse, Saul J. ; Vranješ, Nenad ; Jupe, Andrew ; Drakopoulos, Michael ; O’Hare, Dermot

Review of scientific instruments, 2012-08, Vol.83 (8), p.084101-084101 [Periódico revisado por pares]

United States

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10
New-generation of cryogenic sapphire microwave oscillators for space, metrology, and scientific applications
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New-generation of cryogenic sapphire microwave oscillators for space, metrology, and scientific applications

Giordano, Vincent ; Grop, Serge ; Dubois, Benoît ; Bourgeois, Pierre-Yves ; Kersalé, Yann ; Haye, Gregory ; Dolgovskiy, Vladimir ; Bucalovic, Nikola ; Di Domenico, Gianni ; Schilt, Stéphane ; Chauvin, Jacques ; Valat, David ; Rubiola, Enrico

Review of scientific instruments, 2012-08, Vol.83 (8), p.085113-085113 [Periódico revisado por pares]

United States

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