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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: magazinearticle
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FeedbackNew scientist (1971), 1994-07, Vol.143 (1936), p.84New Scientist LtdTexto completo disponível |
| 2 |
Material Type: magazinearticle
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Cluster cooling issue - ForewordHansen, Klavs ; Bordas, C.International journal of mass spectrometry, 2006, Vol.252 (2) [Periódico revisado por pares]Texto completo disponível |
| 3 |
Material Type: magazinearticle
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Quantum-cascade structure integrates into Si substrateLaser focus world, 2001-02, Vol.37 (2), p.9PennWell Publishing CorpTexto completo disponível |
| 4 |
Material Type: magazinearticle
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Visual acuity stabilizes after SnET2 in subfoveal CNVDUH, ELIA ; Thomas, EdgarOphthalmology times, 1999-09, Vol.24 (17), p.29Intellisphere, LLCTexto completo disponível |
| 5 |
Material Type: magazinearticle
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Academic dictionaries on CD-ROMJacso, PeterComputers in Libraries, 1997-06, Vol.17 (6), p.45-47Westport: Information Today, IncTexto completo disponível |
| 6 |
Material Type: magazinearticle
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Reliability of GaN High-Electron-Mobility Transistors: State of the Art and PerspectivesMeneghesso, G. ; Verzellesi, G. ; Danesin, F. ; Rampazzo, F. ; Zanon, F. ; Tazzoli, A. ; Meneghini, M. ; Zanoni, E.IEEE transactions on device and materials reliability, 2008-06, Vol.8 (2), p.332-343 [Periódico revisado por pares]IEEETexto completo disponível |
| 7 |
Material Type: magazinearticle
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Tectonic model for the Proterozoic growth of North AmericaWhitmeyer, Steven J ; Karlstrom, Karl EGeosphere (Boulder, Colo.), 2007-08, Vol.3 (4), p.220-259 [Periódico revisado por pares]Geological Society of AmericaTexto completo disponível |
| 8 |
Material Type: magazinearticle
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Mechanism of Electron Trapping and Characteristics of Traps in HfO2 Gate StacksBersuker, G ; Sim, J ; Park, Chang Seo ; Young, C ; Nadkarni, S ; Choi, Rino ; Lee, Byoung HunIEEE transactions on device and materials reliability, 2007-03, Vol.7 (1), p.138 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
| 9 |
Material Type: magazinearticle
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Radiation-induced soft errors in advanced semiconductor technologiesBaumann, R.C.IEEE transactions on device and materials reliability, 2005-09, Vol.5 (3), p.305-316 [Periódico revisado por pares]New York: IEEETexto completo disponível |
| 10 |
Material Type: magazinearticle
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Fiber Pulling Profits from Precise PositioningWaken, Florian ; Rauschenbeutel, Arno ; Bartholomaus, ThomasPhotonics spectra (Pittsfield, Mass. 1982), 2008-03, Vol.42 (3), p.73-75Texto completo disponível |
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