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Refinado por: autor: Wang, L. remover autor: Wen, X remover autor: Eklow, W remover
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VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
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VLSI Test Principles and Architectures

Laung-Terng Wu, Cheng-Wen Wen,Xiaoqing Wang Laung-Terng Wang; Xiaoqing Wen; Cheng-Wen Wu Cheng-Wen Wu Xiaoqing Wen; Khader S Abdel-Hafez; Soumendu Bhattacharya; Abhijit Chatterjee; Xinghao Chen; Kwang-Ting (Tim) Cheng; William Eklow; Michael S Hsiao; Wen-Ben Jone; Rohit Kapur; Brion Keller; Kuen-Jong Lee; James C. -M Li; Mike Peng Li

Burlington Morgan Kaufmann 2006

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Deste Autor:

  1. Wen, X
  2. Keller, B
  3. Xiaoqing Wen
  4. Eklow, W
  5. Li, M

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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