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1 |
Material Type: Ata de Congresso
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Testing the Durability of Fluorine-Free Hydrophobic Coatings vs Porous SilicaJones, Luke O. ; Law, Adam M. ; Critchlow, Gary ; Law, John M.2023 IEEE 50th Photovoltaic Specialists Conference (PVSC), 2023, p.1-4IEEESem texto completo |
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2 |
Material Type: Ata de Congresso
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3 |
Material Type: Ata de Congresso
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On the malleability of people and computers: a focused approach to office ethnographyLaw, John ; Whittaker, JohnConference on Supporting Group Work: Proceedings of the third ACM-SIGOIS conference on Office information systems : Providence, Rhode Island, United States; 06-08 Oct. 1986, 1986, p.21-32ACMTexto completo disponível |
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4 |
Material Type: Ata de Congresso
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A Broadband Anti-reflection Coating for Thin Film CdSeTe/CdTe Solar CellsLaw, Adam M ; Kujovic, Luksa ; Togay, Mustafa ; Liu, Xiaolei ; Barth, Kurt ; Walls, John M2023 IEEE 50th Photovoltaic Specialists Conference (PVSC), 2023, p.1-4IEEESem texto completo |
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Material Type: Ata de Congresso
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In-datacenter performance analysis of a tensor processing unitJouppi, Norman P. ; Borchers, Al ; Boyle, Rick ; Cantin, Pierre-luc ; Chao, Clifford ; Clark, Chris ; Coriell, Jeremy ; Daley, Mike ; Dau, Matt ; Dean, Jeffrey ; Gelb, Ben ; Young, Cliff ; Ghaemmaghami, Tara Vazir ; Gottipati, Rajendra ; Gulland, William ; Hagmann, Robert ; Ho, C. Richard ; Hogberg, Doug ; Hu, John ; Hundt, Robert ; Hurt, Dan ; Ibarz, Julian ; Patil, Nishant ; Jaffey, Aaron ; Jaworski, Alek ; Kaplan, Alexander ; Khaitan, Harshit ; Killebrew, Daniel ; Koch, Andy ; Kumar, Naveen ; Lacy, Steve ; Laudon, James ; Law, James ; Patterson, David ; Le, Diemthu ; Leary, Chris ; Liu, Zhuyuan ; Lucke, Kyle ; Lundin, Alan ; MacKean, Gordon ; Maggiore, Adriana ; Mahony, Maire ; Miller, Kieran ; Nagarajan, Rahul ; Agrawal, Gaurav ; Narayanaswami, Ravi ; Ni, Ray ; Nix, Kathy ; Norrie, Thomas ; Omernick, Mark ; Penukonda, Narayana ; Phelps, Andy ; Ross, Jonathan ; Ross, Matt ; Salek, Amir ; Bajwa, Raminder ; Samadiani, Emad ; Severn, Chris ; Sizikov, Gregory ; Snelham, Matthew ; Souter, Jed ; Steinberg, Dan ; Swing, Andy ; Tan, Mercedes ; Thorson, Gregory ; Tian, Bo ; Bates, Sarah ; Toma, Horia ; Tuttle, Erick ; Vasudevan, Vijay ; Walter, Richard ; Wang, Walter ; Wilcox, Eric ; Yoon, Doe Hyun ; Bhatia, Suresh ; Boden, Nan2017 ACM/IEEE 44th Annual International Symposium on Computer Architecture (ISCA), 2017, p.1-12ACMSem texto completo |
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6 |
Material Type: Ata de Congresso
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Durability Testing of Porous SiO2 Anti-reflection Coatings for Solar Cover GlassLaw, Adam M ; Jones, Luke O ; Nasser, Michael ; Abbas, Ali ; Walls, John M2023 IEEE 50th Photovoltaic Specialists Conference (PVSC), 2023, p.1-4IEEESem texto completo |
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7 |
Material Type: Ata de Congresso
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Combined Anti-soiling and Anti-reflection Coatings for Solar ModulesLaw, Adam M ; Bukhari, Farwah ; Jones, Luke O ; Isherwood, Patrick J M ; Walls, John M2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 2021, p.1379-1382IEEESem texto completo |
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8 |
Material Type: Ata de Congresso
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2.3% Efficiency Gains for Silicon Solar Modules Using a Durable Broadband Anti-reflection CoatingLaw, Adam M ; Wright, Lewis D ; Smith, Alex ; Isherwood, Patrick J M ; Walls, John M2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 2020, p.0973-0975IEEESem texto completo |
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9 |
Material Type: Ata de Congresso
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Role of an imaging informatics-based DICOM-RT cancer registry in evaluating treatment parameters of IMRT for prostate cancerDeshpande, Ruchi ; Zhou, Alyssa ; Zhang, Jeffrey ; DeMarco, John ; Liu, Brent J Law, Maria Y ; Boonn, William WProceedings of SPIE, the international society for optical engineering, 2013, Vol.8674, p.86740O-86740O-8SPIESem texto completo |
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10 |
Material Type: Ata de Congresso
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A Practical, Collaborative Approach for Modeling Big Data Analytics Application RequirementsKhalajzadeh, Hourieh ; Simmons, Andrew ; Abdelrazek, Mohamed ; Grundy, John ; Hosking, John ; He, Qiang ; Ratnakanthan, Prasanna ; Zia, Adil ; Law, Meng2020 IEEE/ACM 42nd International Conference on Software Engineering: Companion Proceedings (ICSE-Companion), 2020, p.256-257ACMSem texto completo |