Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Web Resource
|
Fundamentals of Focused Ion Beam Nanostructural Processing: Below, At, and Above the SurfaceMoberlyChan, Warren J ; Adams, David P ; Aziz, Michael ; Hobler, Gerhard ; Schenkel, ThomasMaterials Research Society 2007Texto completo disponível |