Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Spotlight on EW Maintenance: Digital Technology Transforms Electronic Warfare TestingHaystead, JohnJournal of electronic defense, 2012-09, Vol.35 (9), p.44Gainesville: Association of Old CrowsTexto completo disponível |
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2 |
Material Type: Artigo
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Radar, Electronic Warfare, and Electronic Intelligence Testing: Identifying Common Test ChallengesHansen, JohnNASA Tech Briefs, 2012-08, Vol.6 (4), p.24New York: Associated Business PublicationsTexto completo disponível |
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3 |
Material Type: Newsletter Articles
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Air Force to issue RFP for EW T&E. (request for proposal; electronic warfare testing and evaluation)Defense Daily, 1990, Vol.168 (11), p.87Access Intelligence, LLCTexto completo disponível |
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4 |
Material Type: Report
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Joint Test Environment for Electronic Warfare TestingMcCall, James M1998Texto completo disponível |
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5 |
Material Type: Capítulo de Livro
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Robust Testing of Electronic Warfare SystemsChowdhury, Subir ; Wu, Yuin ; Taguchi, GenichiTaguchi's Quality Engineering Handbook, 2004, p.1351-1359Hoboken, NJ, USA: John Wiley & Sons, IncTexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Electronic warfare testing at the Benefield anechoic facilityAli, E.F.1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century, 1997, p.232-243IEEETexto completo disponível |
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7 |
Material Type: Report
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The Utility of Advanced Distributed Simulation for Electronic Warfare TestingWright, Darrell L1999Texto completo disponível |
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8 |
Material Type: Ata de Congresso
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Full operational electronic warfare testing at the flightlineMoskowitz, L.AUTOTESTCON 93, 1993, p.619-624IEEETexto completo disponível |
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9 |
Material Type: Newsletter Articles
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Dyncorp moves into electronic warfare/testingDefense Daily, 1990, Vol.166 (39), p.320Access Intelligence, LLCTexto completo disponível |
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10 |
Material Type: Artigo
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Photonics-Assisted Radio Frequency MemoryZhu, Dan ; Chen, Wenjuan ; Liu, Sijia ; Yang, Yue ; Liu, Jiang ; Ye, Xingwei ; Pan, Minghai ; Pan, ShilongJournal of lightwave technology, 2022-02, Vol.40 (3), p.624-631 [Periódico revisado por pares]New York: IEEETexto completo disponível |