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1
Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings
Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings
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Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings

Iberoamerican Congress on Pattern Recognition (9th 2004 Puebla, Mexico) Alberto Sanfeliu; Jos e Francisco Mart inez Trinidad; Jes us Ariel Carrasco Ochoa

Berlin Springer New York, N.Y 2004

Acesso online. A biblioteca também possui exemplares impressos.

2
Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers
Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers
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Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers

GREC 2003 (2003 Barcelona, Spain) Josep Llad os 1968; Young-Bin Kwon

Berlin Springer New York c2004

Acesso online. A biblioteca também possui exemplares impressos.

3
Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers
Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers
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Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers

International Workshop on Graphics Recognition (6th 2005 Hong Kong, China) Wenyin Liu; Josep Llad os 1968; International Association for Pattern Recognition

Berlin Springer New York c2006

Localização: ICMC - Inst. Ciên. Mat. Computação    (68-02 LNCS v.3926 ) e outros locais(Acessar)

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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