Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Wireless Optical Communication SystemsHranilovic, SteveNew York, NY: Springer-Verlag 2005Sem texto completo |
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2 |
Material Type: Livro
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Transmission Electron Microscopy: A Textbook for Materials ScienceWilliams, David B ; Carter, C. Barry Carter, C. BarryNew York, NY: Springer Nature 2009Texto completo disponível |
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3 |
Material Type: Livro
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Transmission Electron Microscopy and Diffractometry of MaterialsFultz, Brent ; Howe, James M Howe, JamesBerlin, Heidelberg: Springer Nature 2007Texto completo disponível |
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4 |
Material Type: Livro
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEMEgerton, R. FNew York: Springer Science + Business Media 2005Sem texto completo |
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5 |
Material Type: Livro
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Scanning Microscopy for Nanotechnology: Techniques and Applications (Advances in Astrobiology and Biogeophysics)Zhou, Weilie ; Wang, Zhong-lin Wang, Zhong Lin ; Zhou, WeilieNew York, NY: Springer-Verlag 2007Sem texto completo |
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6 |
Material Type: Livro
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Transmission electron microscopy: a textbook for materials scienceWilliams, David B ; Carter, C. BarrySpringer 2013Texto completo disponível |
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7 |
Material Type: Livro
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Spin-Orbit Coupling Effects in Two-Dimensional Electron and Hole SystemsWinkler, RolandBerlin, Heidelberg: Springer Berlin / Heidelberg 2003Texto completo disponível |
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8 |
Material Type: Livro
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Semiconductor Spintronics and Quantum ComputationAwschalom, D. D ; Loss, D ; Samarth, NBerlin, Heidelberg: Springer Berlin Heidelberg 2002Texto completo disponível |
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9 |
Material Type: Livro
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Electronic and Magnetic Properties of Chiral Molecules and Supramolecular ArchitecturesNaaman, Ron ; Beratan, David N ; Waldeck, David Naaman, Ron ; Waldeck, David ; Beratan, David N ; Naaman, Ron ; Waldeck, David ; Beratan, David NBerlin, Heidelberg: Springer Nature 2011Sem texto completo |
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10 |
Material Type: Livro
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Scanning probe microscopy: the lab on a tipMeyer, E. (Ernst) ; Hug, Hans J. (Hans Josef) ; Bennewitz, RolandNew York: Springer 2004Texto completo disponível |