Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Embedded processor design challenges systems, architectures, modeling, and simulation : SAMOSSAMOS 2001 (2001 Samos Island, Greece) Ed. F Deprettere 1944-; Jürgen Teich 1964-; Stamatis VassiliadisBerlin Springer London 2002Localização: ICMC - Inst. Ciên. Mat. Computação (68-02 LNCS v.2268 ) e outros locais(Acessar) |
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2 |
Material Type: Livro
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Embedded computer systems architectures, modeling, and simulation : 7th international workshop SAMOS 2007, Samos, Greece, July 16-19, 2007 : proceedingsSAMOS 2007 (2007 Samos, Greece) Stamatis Vassiliadis; Mladen Berekovi c; Timo D H am al ainenBerlin Springer c2007Localização: IME - Inst. Matemática e Estatística (S L471c v.4599 )(Acessar) |
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3 |
Material Type: Livro
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Embedded computer systems : architectures, modeling, and simulation : 5th international workshop SAMOS 2005, Samos, Greece, July 18-20, 2005 : proceedingsSAMOS 2005 (2005 Samos, Greece) Timo D H am al ainen; Andy D Pimentel; Jarmo Takala; Stamatis VassiliadisBerlin Springer New York c2005Acesso online. A biblioteca também possui exemplares impressos. |
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4 |
Material Type: Livro
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Embedded Processor Design Challenges: Systems, Architectures, Modeling, and Simulation - SAMOSDeprettere, Ed F ; Vassiliadis, Stamatis Deprettere, Ed F ; Vassiliadis, Stamatis ; Vassiliadis, Stamatis ; Deprettere, Ed F. ; Teich, JürgenBerlin, Heidelberg: Springer Nature 2003Texto completo disponível |
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5 |
Material Type: Ata de Congresso
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A streaming machine description and programming modelCarpenter, Paul ; Ródenas Picó, David ; Martorell Bofill, Xavier ; Ramírez Bellido, Alejandro ; Ayguadé Parra, Eduard2007Texto completo disponível |
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6 |
Material Type: Artigo
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The ARISE Approach for Extending Embedded Processors With Arbitrary Hardware AcceleratorsVassiliadis, N. ; Theodoridis, G. ; Nikolaidis, S.IEEE transactions on very large scale integration (VLSI) systems, 2009-02, Vol.17 (2), p.221-233 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |